Au-Ge-based alloys are interesting as novel high-temperature lead-free solders because of their low melting point, good thermal and electrical conductivity, and high corrosion resistance. In the present work, the wetting and soldering behavior of the eutectic Au-28Ge (at.%) alloy on Cu and Ni substrates have been investigated. Good wetting on both substrates with final contact angles of 13° to 14° was observed. In addition, solder joints with bond shear strength of 30 MPa to 35 MPa could be produced under controlled conditions. Cu substrates exhibit pronounced dissolution into the Au-Ge filler metal. On Ni substrates, the NiGe intermetallic compound was formed at the filler/substrate interface, which prevents dissolution of Ni into the solder. Using thin filler metal foils (25 μm), complete consumption of Ge in the reaction at the Ni interface was observed, leading to the formation of an almost pure Au layer in the soldering zone.
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Leinenbach, C., Valenza, F., Giuranno, D. et al. Wetting and Soldering Behavior of Eutectic Au-Ge Alloy on Cu and Ni Substrates. J. Electron. Mater. 40, 1533–1541 (2011). https://doi.org/10.1007/s11664-011-1639-4
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DOI: https://doi.org/10.1007/s11664-011-1639-4