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Microscopic Description of Spontaneous Emission in Stark Chirped Rapid Adiabatic Passages

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Abstract

A microscopic approach describing the effect of spontaneous emission in the stark-chirped rapid adiabatic passages (SCRAPs) for quantum computation is presented. Apart from the phenomenological model, this microscopic one can investigate the dependence of the population dynamics both on the temperature of the environment and the decay rate γ. With flux-biased Josephson qubits as a specifical example, we study the efficiency of the SCRAP for realizing the basic Pauli-X and iSWAP gates. Our results show clearly that the behavior of the population transfer described by the microscopic model is similar with the phenomenological one at zero temperature. In the limit of very high temperature, the population probabilities of the qubit states exhibit strong stability properties. High efficiency for the quantum gate manipulations in SCRAPs is available against the weak decay rate γ ≪ 1 at low temperature.

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Acknowledgements

This work was supported in part by the National Natural Science Foundation of China though Grant Nos. 61601433, 11547105, 11405171, the foundation from Chongqing Science and Technology Commission under grant No. CSTC2013jcyj40001, the CAS Light of West China Program, the Anhui Provincial Natural Science Foundation though Grant No. 1608085QF139, and the China Postdoctoral Science Foundation though Grant No. 2016M600906.

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Authors and Affiliations

  1. Center of Quantum Information Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Science, Chongqing, 400714, China

    Xuan Shi & Hong-Quan Zhao

  2. Quantum Physics and Quantum Information Division, Beijing Computational Science Research Center, Beijing, 100193, China

    Hao Yuan

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  1. Xuan Shi
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  2. Hao Yuan
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  3. Hong-Quan Zhao
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Correspondence to Xuan Shi.

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Shi, X., Yuan, H. & Zhao, HQ. Microscopic Description of Spontaneous Emission in Stark Chirped Rapid Adiabatic Passages. Int J Theor Phys 57, 9–19 (2018). https://doi.org/10.1007/s10773-017-3535-z

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  • DOI: https://doi.org/10.1007/s10773-017-3535-z

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