Abstract
The problem is considered here of determining, by an experimental method, the height of potential barriers in metal — dielectric — metal tunnel structures at the junctions. Formulas are derived according to which one can calculate the height of a potential barrier from measurements of the first and the second derivative of the tunnel current with respect to the bias voltage across a junction.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 5, pp. 30–35, May, 1975.
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Severdenko, V.P., Labunov, V.A., Tkharev, E.E. et al. Determining the height of potential barriers in metal — dielectric — metal tunnel structures by the method of derivatives of the volt — ampere characteristics. Soviet Physics Journal 18, 618–622 (1975). https://doi.org/10.1007/BF00893990
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DOI: https://doi.org/10.1007/BF00893990