Abstract
The adsorption of self-organizing thiol films on polycrystalline gold substrates was investigated in situ by optical second harmonic generation. Growth of the films could be detected at submonolayer coverage. For a comparison with classical surface analytical methods the thiol coverage was measured ex situ by X-ray photoelectron spectroscopy. We find that formation of ordered thiol films up to monolayer coverage can be described by Langmuir adsorption kinetics.
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Buck, M., Eisert, F., Fischer, J. et al. Investigation of self-organizing thiol films by optical second harmonic generation and X-ray photoelectron spectroscopy. Appl. Phys. A 53, 552–556 (1991). https://doi.org/10.1007/BF00331545
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DOI: https://doi.org/10.1007/BF00331545