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Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode

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Applied Scanning Probe Methods IX

Part of the book series: Nano Science and Technolgy ((NANO))

Abstract

In this contribution we present the potential of digital pulsed force mode (DPFM) atomic forcemicroscopy (AFM) formapping the local mechanical properties to surface topology. In the first part, we review the pulsed force mode principles and compare this mode with other common modes of dynamic AFM operation. Then, we present an overview of the different model for tip–sample interaction based on continuum mechanics theories. In a general view, we then show how the huge amount of data that is acquired during DPFM imaging is stored and how it can be processed in order to provide insight into local mechanics of the sample surfaces. Applications of this measurement technique show the possible impact of DPFM on condensed soft matter samples as well as possible extensions towards measurements of the in-plane mechanics of the tip and the surface. All mechanical DPFM data were analyzed on the basis of continuum mechanical models. We conclude our contribution with an overview of this technique and its benefits for lateral compositional mapping.

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Author information

Authors and Affiliations

  1. Sektion Kristallographie, Ludwig-Maximilians-Universität München, Theresienstraße 41/II, 80333, München, Germany

    Alexander M. Gigler

  2. Experimental Physics, Ulm University, 89069, Ulm, Germany

    Othmar Marti

Authors
  1. Alexander M. Gigler
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  2. Othmar Marti
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Editor information

Editors and Affiliations

  1. Advanced Institute of Science & Technology, School of Materials Science, 923-1292, Ishikawa, Japan

    Masahiko Tomitori

  2. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, W390 Scott Laboratory, 201W. 19th Avenue, 43210-1142, Columbus, Ohio, USA

    Bharat Bhushan

  3. Institute of Physics, FB 16, University of Münster, Wilhelm-Klemm-Str. 10, 48149, Münster, Germany

    Harald Fuchs

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Gigler, A., Marti, O. (2008). Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode. In: Tomitori, M., Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods IX. Nano Science and Technolgy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74083-4_2

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