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Handbook of Sol-Gel Science and Technology pp 1–30Cite as

Characterization of Electrical Properties

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Abstract

Materials with advanced electrical properties are in great demand for the realization of the manifold products of information technology. Examples for such materials are transparent conductive coatings for touch screens or flat-panel displays, superconductors for high-frequency applications, or semiconducting sensor materials for gas detection systems. This chapter describes the most commonly used techniques for the electrical characterization of sol–gel materials. In the first section “Electrical Conductivity,” a short introduction into the terminology is given, and the fundamental techniques for resistance measurement are described. For characterization of semiconductors, not only the resistivity but also the charge carrier density and mobility and in addition the type of charge carriers (electrons or holes) are of great interest and can be determined by measurement of the Hall effect, which is explained in the second section on “Hall Effect Measurements.” Frequency-dependent electrical properties of materials and interfaces can be investigated by impedance spectroscopy and are covered in the section “Impedance Spectroscopy.” The work function is of high interest especially for materials used in displays and solar cells and can be studied by Kelvin probe, which is explained in the last section on “Work Function and Surface Potential (Kelvin Probe),” followed by a conclusion.

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Notes

  1. 1.

    The probe spacing s of 1.588 mm (62.5 mils) owes its popularity to the fact that the factor 2π s in Eq. ( 7 ) becomes unity, and hence, the reading directly gives the resistivity.

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Authors and Affiliations

  1. Carl Zeiss Smart Optics GmbH, Turnstrasse 27, 73430, Aalen, Germany

    Jörg Pütz

  2. Campus D2 2, INM – Leibniz Institute for New Materials, 66123, Saarbruecken, Germany

    Sabine Heusing

  3. Ch. des Placettes 6, 1041, Bottens, Switzerland

    Michel A. Aegerter

Authors
  1. Jörg Pütz
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  2. Sabine Heusing
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  3. Michel A. Aegerter
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Corresponding author

Correspondence to Jörg Pütz .

Editor information

Editors and Affiliations

  1. Rutgers University, Piscataway, New Jersey, USA

    Lisa Klein

  2. Madrid, Spain

    Mario Aparicio

  3. City University of New York, New York, USA

    Andrei Jitianu

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© 2016 Springer International Publishing Switzerland

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Pütz, J., Heusing, S., Aegerter, M.A. (2016). Characterization of Electrical Properties. In: Klein, L., Aparicio, M., Jitianu, A. (eds) Handbook of Sol-Gel Science and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-19454-7_52-1

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  • DOI: https://doi.org/10.1007/978-3-319-19454-7_52-1

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  • Publisher Name: Springer, Cham

  • Online ISBN: 978-3-319-19454-7

  • eBook Packages: Springer Reference Chemistry and Mat. ScienceReference Module Physical and Materials ScienceReference Module Chemistry, Materials and Physics

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