Abstract
A critical aspect in the design of a short-wavelength microscope is the illumination profile and stability. Experimental measurements of the pointing stability and divergence and optical corrections of X-ray laser source are shown. The optical corrections provided one order of magnitude improvement in the illumination performance.
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References
Goldberg, K.A., Mochi, I.: J. Vac. Sci. Technol. B 28(6), C6E1(2010)
Präg, A.R., Kozlovà, M., Rus, B., Rohlena, K.: Eur. Phys. J. B 26, 59–65 (2003)
Staub, F., Braud, M., Balmer, J.E., Nielsen, J., Bajt, S.: Appl. Phys. B 78, 7–8 (2004)
Grünig, M., Imesch, C., Staub, F., Balmer, J.E.: Opt. Commun. 282, 267–271 (2009)
Masoudnia, L., Bleiner, D.: In: Sebban, S., et al. (eds.) X-Ray Lasers 2012. Springer Proceedings in Physics, vol. 147. Springer, Cham (2013). Chapter 27 in this book
Acknowledgements
The present work was supported by the Swiss National Science Foundation under the grant number PP00P2-133564/1.
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Ruiz-Lopez, M., Staub, F., Bleiner, D. (2014). Optical Correction of X-Ray Laser Illumination for Short-Wavelength Microscopy. In: Sebban, S., Gautier, J., Ros, D., Zeitoun, P. (eds) X-Ray Lasers 2012. Springer Proceedings in Physics, vol 147. Springer, Cham. https://doi.org/10.1007/978-3-319-00696-3_36
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DOI: https://doi.org/10.1007/978-3-319-00696-3_36
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-00695-6
Online ISBN: 978-3-319-00696-3
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