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Topological Homogeneity for Electron Microscopy Images

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Computational Topology in Image Context (CTIC 2019)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 11382))

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Abstract

In this paper, the concept of homogeneity is defined, from a topological perspective, in order to analyze how uniform is the material composition in 2D electron microscopy images. Topological multiresolution parameters are taken into account to obtain better results than classical techniques.

This work has been supported by the Spanish research projects MTM2016-81030-P, TEC2012-37868-C04-02 (AEI/FEDER, UE) and the VPPI of the University of Seville.

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Author information

Authors and Affiliations

  1. H.T.S. Informatics’ Engineering, University of Seville, Seville, Spain

    Helena Molina-Abril, Fernando Diaz del Rio & Pedro Real

  2. Department of Computer Science and Engineering, University of Cadiz, 11510, Puerto Real, Cadiz, Spain

    Maria P. Guerrero-Lebrero, Guillermo Barcena, Elisa Guerrero & Pedro L. Galindo

  3. University Research Institute on Electron Microscopy and Materials (IMEYMAT), University of Cadiz, 11510, Puerto Real, Cadiz, Spain

    Veronica Braza & David Gonzalez

Authors
  1. Helena Molina-Abril
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  2. Fernando Diaz del Rio
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  3. Maria P. Guerrero-Lebrero
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  4. Pedro Real
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  5. Guillermo Barcena
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  6. Veronica Braza
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  7. Elisa Guerrero
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  8. David Gonzalez
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  9. Pedro L. Galindo
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Corresponding author

Correspondence to Helena Molina-Abril .

Editor information

Editors and Affiliations

  1. Universidad de Málaga, Málaga, Spain

    Rebeca Marfil

  2. Universidad de Málaga, Málaga, Spain

    Mariletty Calderón

  3. University of Seville, Sevilla, Spain

    Fernando Díaz del Río

  4. University of Seville, Sevilla, Spain

    Pedro Real

  5. Universidad de Málaga, Málaga, Spain

    Antonio Bandera

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Molina-Abril, H. et al. (2019). Topological Homogeneity for Electron Microscopy Images. In: Marfil, R., Calderón, M., Díaz del Río, F., Real, P., Bandera, A. (eds) Computational Topology in Image Context. CTIC 2019. Lecture Notes in Computer Science(), vol 11382. Springer, Cham. https://doi.org/10.1007/978-3-030-10828-1_13

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  • DOI: https://doi.org/10.1007/978-3-030-10828-1_13

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-10827-4

  • Online ISBN: 978-3-030-10828-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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