Abstract
Atomic force microscopy (AFM) measurements could be affected by different kinds of artifacts; some of them derive from the improper use of the instrument and can be avoided by setting the correct experimental parameters and conditions. In other cases, distortions of the images acquired by AFM are intrinsically related to the operating principle of the instrument itself and to the kind of interactions taken into account for the reconstruction of the sample topography. A perfect knowledge of all the artifacts that can perturb AFM measurements is fundamental to avoid misleading interpretations of the results. In this chapter, all the most common sources of artifact are presented, and strategies to avoid them are proposed.Subheading 1 is a brief introduction to the chapter. In Subheading 2, the artifacts due to the interactions between the sample and the AFM tip are presented. Subheading 3 is focused on the deformations due to the AFM scanner nonlinear movements. The interaction with the environment surrounding the instrument can affect the quality of the AFM results and the environmental instability are discussed in Subheading 4. Subheading 5 shows the effects of an incorrect setting of the feedback gains or other parameters. Subheading 6 aims on the artifacts that can be produced by the improper use of the image processing software. Subheading 7 is a short guide on the test that can be done to easily recognize some of the artifacts previously described.
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References
Keller, D., and Chih-Chung, C. (1991) Reconstruction of STM and AFM images distorted by finite-size tips. Surface Sci. 253, 353–364.
Hellemans, L., Waeyaert, K., Hennau, F., Stockman, L., Heyvaert, I., and Van Haesendonck, C. (1991) Can atomic force microscopy tips be inspected by atomic force microscopy? J. Vac. Sci. Technol. B. 9, 1309–1312.
Keller, D. and Chou, C. C. (1992) Imaging steep, high structures by scanning force microscopy with electron beam deposited tips. Surface Sci. 268, 333–339.
Keller, D., Deputy, D., Alduino, A., and Luo, K. (1992) Sharp, vertical-walled tips for SFM imaging of steep or soft samples. Ultramicroscopy 42–44, 1481–1489.
Wang, W. L. and Whitehouse, D. J. (1995) Application of neural networks to the reconstitution of scanning probe microscope images distorted by finite-size tips. Nanotechnology 6, 45–51.
Markiewicz, P. and Goh, M. C. (1995). Atomic force microscope tip deconvolution using calibration arrays. Rev. Sci. Instrum. 66, 1–4.
Villarrubia, J. S. (1996) Scanned probe microscope tip characterization without cantilever tip characterizers. J. Vac. Sci. Technol. B. 14, 1518–1521.
Sheng, S., Czajkowsky, D. M., and Shao, Z. (1999) AFM tips: How sharp are they? J. Microsc. 196, 1–5.
Taatjes, D. J., Quinn, A. S., Lewis, M. R., and Bovill, E. G. (1999) Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images. Microsc. Res. Tech. 44, 312–326.
Dinte, B. P., Watson, G. S., Dobson, J. F., and Myhra, S. (1996) Artefacts in noncontact mode force microscopy: The role of adsorbed moisture. Ultramicroscopy 63, 115–124.
Yang, J., Mou, J., Yuan, J.-Y., and Shao, Z. (1996) The effect of deformation on the lateral resolution of the atomic force microscopy. J. Microsc. 182, 106–113.
van Noort, S. J., van der Werf, K. O., de Grooth, B. G., van Hulst, N. F., and Greve, J. (1997) Height anomalies in tapping mode atomic force microscopy in air caused by adhesion. Ultramicroscopy 69, 117–127.
Kühle, A., Sorenson, A. H., Zandbergen, J. B., and Bohr, J. (1998) Contrast artifacts in tapping tip atomic force microscopy. Appl. Phys. A. 66, S329–S332.
Paredes, J. I., Martinez-Alonso, A., and Tascon, J. M. (2000) Adhesion artefacts in atomic force microscopy imaging. J. Microsc. 200, 109–113.
Cao, H., and Evans A.G. (1993). Nonlinear deformation of ferroelectric ceramics. J. Amer. Ceram. Soc . 76, 890–896.
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Canale, C., Torre, B., Ricci, D., Braga, P.C. (2011). Recognizing and Avoiding Artifacts in Atomic Force Microscopy Imaging. In: Braga, P., Ricci, D. (eds) Atomic Force Microscopy in Biomedical Research. Methods in Molecular Biology, vol 736. Humana Press. https://doi.org/10.1007/978-1-61779-105-5_3
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DOI: https://doi.org/10.1007/978-1-61779-105-5_3
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