Abstract
Many problems fundamental to the preparation of high quality Josephson junctions are strongly related to interface morphology in the superconducting electrodes and the insulator layer. One of the problems for NbN films is that the superconducting coherence length, ξ, of NbN is at least a factor of 2 lower than for Nb. For NbN and Nb, ξ (4.2 K) is 4–7 nm and 10–30 nm, respectively.1 Another problem is that the NbN films are often inhomogeneous, and their properties are very sensitive to film preparation conditions. Variations in grain size, crystalline orientation, voids and columnar growth all contribute to changes in the electrical properties of the films.
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© 1990 Plenum Press, New York
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Hamasaki, K., Irie, A., Wang, Z., Yamashita, T., Watanabe, K. (1990). Thin Film Preparation and Device Applications of Epitaxial MgO/NbN Multilayers. In: Reed, R.P., Fickett, F.R. (eds) Advances in Cryogenic Engineering Materials . An International Cryogenic Materials Conference Publication, vol 36. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9880-6_49
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DOI: https://doi.org/10.1007/978-1-4613-9880-6_49
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