Abstract
Contemporary IVEMs as typified by those from JEOL (JEM-2010 and JEM-3010) and FEICO/Philips (Tecnai T20 and Tecnai T30) possess most of the advantages of beam penetration of HVEMs without most of the disadvantages associated with HVEM cost, stability, and Space requirements. The original IVEM units did not provide images at low accelerating voltages (100-120 kV) that were comparable with conventional TEM images, but modern IVEMs are considerably more flexible. It is now possible to achieve high resolution for both ultrathin sections and semithin sections in excess of 3 p,m with IVEMs, particularly if equipped with energy filtration systems.
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Dykstra, M.J., Reuss, L.E. (2003). Intermediate Voltage Electron Microscopes (IVEM), Electron Tomography, and Single-Particle Electron Microscopy. In: Biological Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-9244-4_20
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DOI: https://doi.org/10.1007/978-1-4419-9244-4_20
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