Abstract
This chapter discusses polarization dependent X-ray photoemission electron microscopy (X-PEEM) and its application to coupled magnetic layers, in particular ferromagnet-antiferromagnet structures.
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Scholl, A., Ohldag, H., Nolting, F., Anders, S., Stöhr, J. (2005). Study of Ferromagnet-Antiferromagnet Interfaces Using X-Ray PEEM. In: Hopster, H., Oepen, H.P. (eds) Magnetic Microscopy of Nanostructures. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26641-0_2
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DOI: https://doi.org/10.1007/3-540-26641-0_2
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