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Thermal Runaway and Thermal Management

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Thermal and Power Management of Integrated Circuits

Part of the book series: Series on Integrated Circuits and Systems ((ICIR))

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Abstract

This chapter begins with the concept of the thermal runaway and optimization methods to prevent the thermal runaway during reliability screening test (burn-in). Then we review the thermal management of the VLSI circuits during normal operating conditions to prevent thermal runaway and finally discuss the temperature measurement methods.

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(2006). Thermal Runaway and Thermal Management. In: Thermal and Power Management of Integrated Circuits. Series on Integrated Circuits and Systems. Springer, Boston, MA. https://doi.org/10.1007/0-387-29749-9_5

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  • DOI: https://doi.org/10.1007/0-387-29749-9_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-25762-4

  • Online ISBN: 978-0-387-29749-1

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