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© 1999 Springer-Verlag
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(1999). Volume defects in layers. In: High-Resolution X-Ray Scattering from Thin Films and Multilayers. Springer Tracts in Modern Physics, vol 149. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0109394
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DOI: https://doi.org/10.1007/BFb0109394
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