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X-ray absorption and reflection in materials sciences

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Festkörperprobleme 29

Part of the book series: Advances in Solid State Physics ((ASSP,volume 29))

Abstract

The X-ray absorption spectroscopy (XAS) is a local probe of the geometric and electronic structure of specific atoms in condensed matter. Wit the vailability of synchrotron radiation from storage rings it, has found widespread use in science and technology, giving internatomic distances, coordination numbers, electronic densities of state and the valence of the absorbing species. Like all X-ray techniques XAS can be made surface and interface sensitive by means of external total reflection with a probing depth as low as 20 to 70 Å. This new development is described in detail. Reflectivity measurements as a function of the angle of grazing incidence give the mass density in the surface layer, its thickness and the roughness of interfaces. The chemical composition and its depth profile can be determined in a non-destructive way by measuring the energy and angular dependence of the fluorescence intensity. A number of examples from materials science and technology will illustrate these spectroscopies.

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Authors and Affiliations

  1. Institut für Festkörperforschung, Kernforschungsanlage Jülich, Postfach 1913, D-5170, Jülich, Federal Republic of Germany

    Bruno Lengeler

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  1. Bruno Lengeler
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Ulrich Rössler

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© 1989 Friedr. Vieweg & Sohn Verlagsgesellschaft mbH

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Lengeler, B. (1989). X-ray absorption and reflection in materials sciences. In: Rössler, U. (eds) Festkörperprobleme 29. Advances in Solid State Physics, vol 29. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0108007

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  • DOI: https://doi.org/10.1007/BFb0108007

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-528-08035-8

  • Online ISBN: 978-3-540-75350-6

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