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Surface analysis: Aspects of atomic beam scattering, secondary ion mass spectroscopy and vibrational spectroscopies

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Festkörperprobleme 18

Part of the book series: Advances in Solid State Physics ((ASSP,volume 18))

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Abstract

From the many methods in surface analysis some aspects of low energy atomic beam scattering (LEAS), secondary ion mass spectroscopy (SIMS), ion back scattering spectroscopy (IBS), and vibrational spectroscopies as electron energy loss spectroscopy (ELS), infrared reflection spectroscopy (IRS) and laser Raman spectroscopy (LRS) will be discussed.

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Authors and Affiliations

  1. Physikalisches Institut der Universität Erlangen-Nürnberg, Erlangen, Germany

    Heinz Wilsch

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  1. Heinz Wilsch
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J. Treusch

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© 1978 Friedr. Vieweg & Sohn Verlagsgesellschaft mbH

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Wilsch, H. (1978). Surface analysis: Aspects of atomic beam scattering, secondary ion mass spectroscopy and vibrational spectroscopies. In: Treusch, J. (eds) Festkörperprobleme 18. Advances in Solid State Physics, vol 18. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0107779

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  • DOI: https://doi.org/10.1007/BFb0107779

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-528-08024-2

  • Online ISBN: 978-3-540-75362-9

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