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Case studies in industrial mathematics

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Part of the Lecture Notes in Mathematics book series (LNMCIME,volume 1521)

Keywords

  • Learning Rule
  • Interference Term
  • Rotational Invariance
  • Contact Resistivity
  • Partial Coherence

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References

  1. Born, M. and E. Wolf, (1970): Principles of Optics, fourth edition. Pergamon Press, New York

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References

  1. Busenberg, S. and W. Fang, (1991): Identification of semiconductor contact resistivity, Quart. Appl. Math., 64, 639–649.

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  2. Fang, W. and E. Cumberbatch, (1990): Inverse problems for MOSFET contact resistivity, SIAM J. Applied Math., to appear.

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  3. Fang, W., (1990): Identification of transistor contact resistivity, Ph.D. Thesis, Claremont Graduate School.

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  4. Loh, W. H., (1987): Modelling and measurement of contact resistance, Stanford Electronic Labs., Tech. Rep., No. G830-1.

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  5. Loh, W. H., K. Saraswat and R. W. Dutton, (1985): Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity, IEEE Electron Device Letters, 6, 105–108.

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References

  1. Armstrong, F., J. Brennock, K. Ring, and L. Rossi (student team), S. Busenberg (faculty), R. Schlunt (liaison), H. Thieme (consultant), (1988): Mathematical Modeling and Simulation of a Neural Image Classifier, Harvey Mudd College Mathematics Clinic Report.

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  2. Fukushima, K., (1980): Neocognitron: a self-organizing network model for a mechanism of pattern recognition unaffected by shift in position, Biological Cybernetics, 36, pp. 193–202.

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  4. Hopfield, J. (1982): Neural networks and Physical systems with emergent collective computational abilities, Proc. Natl. Acad. Sci. USA, 79, pp. 2554–2558.

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© 1992 Springer-Verlag

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Busenberg, S. (1992). Case studies in industrial mathematics. In: Capasso, V., Fasano, A. (eds) Mathematical Modelling of Industrial Processes. Lecture Notes in Mathematics, vol 1521. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0098367

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  • DOI: https://doi.org/10.1007/BFb0098367

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-55595-7

  • Online ISBN: 978-3-540-47247-6

  • eBook Packages: Springer Book Archive