A new universal test for bit strings
A new universal statistical test for random bit generators is presented. The test is an attempt to implement the concepts of the next-bit test theory. Given the statistics of a binary string and a small portion of it, the parameter of the test is related to the amount of next bits which can be guessed. The test detects local as well as overall non-random behaviour of the string. It can be applied for all the strings, from rather small to the large. It is easy to implement, and well suited for cryptographic applications.
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