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On the complexity of testing for catastrophic faults

  • N. Santoro
  • J. Ren
  • A. Nayak
Session 6
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1004)

Abstract

In this paper, the problem of determining a fault pattern to be catastrophic for unidirectional linear array with k- link redundancy is studied. First, we establish a necessary and sufficient condition for a fault pattern to be catastrophic. Based on this necessary and sufficient condition, we derive an efficient testing algorithm whose complexity is O(mk), where k is the number of bypass links, and m is the number of faults. This testing scheme, which improves the existing O(mk log k) bound, is based on a novel “geometric” approach.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1995

Authors and Affiliations

  • N. Santoro
    • 1
  • J. Ren
    • 1
  • A. Nayak
    • 1
  1. 1.School of Computer ScienceCarleton UniversityOttawaCanada

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