Abstract
There have been several approaches created for modelling the failure mechanisms of repairable devices. The models are divided into three ranges based on various hypotheses regarding the repairs, i.e. minimal, general and perfect repair. In the article, our aim is to develop the log-linear model based upon assumptions of general repair. The Kijima virtual age model incorporates this model for considering the reparation impact on the severity of failure.
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Bhardwaj, S., Mogha, S.K., Garg, V. (2023). Mathematical Modelling of Failure Process for Repairable Systems. In: Sahni, M., Merigó, J.M., Hussain, W., León-Castro, E., Verma, R.K., Sahni, R. (eds) Mathematical Modeling, Computational Intelligence Techniques and Renewable Energy. Advances in Intelligent Systems and Computing, vol 1440. Springer, Singapore. https://doi.org/10.1007/978-981-19-9906-2_14
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DOI: https://doi.org/10.1007/978-981-19-9906-2_14
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