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Introduction to In-Situ Transmission Electron Microscopy

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In-Situ Transmission Electron Microscopy

Abstract

The capability to capture the evolution of the structure and properties of nanomaterials in response to external stimuli makes in situ transmission electron microscopy ideally suited to tackle the present challenges of the nanoworld. In situ transmission electron microscopy has become one of the most powerful approaches for revealing physical and chemical process dynamics at atomic resolution. This chapter gives an overview of in situ transmission electron microscopy. The background, the early history, and the current status of in situ transmission electron microscopy are briefly reviewed, and the challenges, as well as future opportunities, are discussed.

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Sun, L., Xu, T., Zhang, Z. (2023). Introduction to In-Situ Transmission Electron Microscopy. In: Sun, L., Xu, T., Zhang, Z. (eds) In-Situ Transmission Electron Microscopy. Springer, Singapore. https://doi.org/10.1007/978-981-19-6845-7_1

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