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Correlative Electron Microscopy and Atom Probe Tomography—Experimental Techniques and Its Applications

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New Horizons in Metallurgy, Materials and Manufacturing

Part of the book series: Indian Institute of Metals Series ((IIMS))

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Abstract

In recent times, applying correlative experimental techniques using electron microscopy (EM) and atom probe tomography (APT) to interpret several materials science problems have shown promising results. Especially, getting structural and three-dimensional compositional information from the same region of interest on a material led to understanding mechanisms occurring at the atomic scale. Direct integration of these mechanisms with material properties can open avenues for new material development. Some recent correlative experimental methods and protocols will be discussed in this chapter with relevant examples.

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Acknowledgements

The author is grateful to the workshop organizers for their invitation to contribute to this book. The author also acknowledges electron microscopy, atom probe tomography, and ion beam facilities in IISc Bangalore and MPIE. The author is thankful to Professor Baptiste Gault, Professor Dierk Raabe, Professor Kamanio Chattopadhyay, and Professor Dipankar Banerjee for their constant support and encouragement. The authors also acknowledge the financial support from SERB India, IISc for SEED Grant, and MPG-IISc Partner Group.

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Authors and Affiliations

  1. Department of Materials Engineering, Indian Institute of Science Bangalore, Bangalore, India

    Surendra Kumar Makineni

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  1. Surendra Kumar Makineni
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Correspondence to Surendra Kumar Makineni .

Editor information

Editors and Affiliations

  1. Department of Mechanical Engineering, Indian Institute of Technology Bombay, Mumbai, Maharashtra, India

    Amber Shrivastava

  2. Materials Science and Engineering, Indian Institute of Technology Gandhinag, Gandhinagar, Gujarat, India

    Amit Arora

  3. Department of Materials Engineering, Indian Institute of Science, Bangalore, Karnataka, India

    Chandan Srivastava

  4. Department of Metallurgical and Materials Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India

    Nikhil Dhawan

  5. Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, Uttar Pradesh, India

    Sudhanshu Shekhar Singh

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Makineni, S.K. (2023). Correlative Electron Microscopy and Atom Probe Tomography—Experimental Techniques and Its Applications. In: Shrivastava, A., Arora, A., Srivastava, C., Dhawan, N., Shekhar Singh, S. (eds) New Horizons in Metallurgy, Materials and Manufacturing. Indian Institute of Metals Series. Springer, Singapore. https://doi.org/10.1007/978-981-19-5570-9_2

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