Skip to main content

Research on Image Acquisition Preprocessing and Data Augmentation Algorithm Based on Strip Surface Defect Detection Technology

  • Conference paper
  • First Online:
Advanced Manufacturing and Automation XI (IWAMA 2021)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 880))

Included in the following conference series:

  • 1513 Accesses

Abstract

The identification of strip steel surface defect is an important index to test its quality. With the development of deep learning technology, strip surface detection has developed from traditional machine learning algorithm recognition to deep neural network detection. Existing deep learning strip detection algorithms mainly focus on the tuning and identification of standard defect data sets, while few focus on the preliminary preparation processes such as the collection and pretreatment of the original data of the production line. To address this problem, this paper proposes a series of image data acquisition and pre-processing algorithms for strip surface defect detection technology, such as out-of-area background shielding, noise filtering, suspected defect image acquisition, light equalization and image enhancement processing. Light equalization and image enhancement processing and a series of image data acquisition and pre-processing algorithms to quickly eliminate invalid data from the collected image data and retain valid data. And for the image ROI region data broadening, effectively solve the problem of insufficient defect samples, for the existing deep learning strip inspection algorithm to provide a standard training and testing data set. The image acquisition pre-processing and data augmentation algorithm in this paper is also of practical value when extended to other products in the field of surface inspection.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 189.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 249.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 249.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Srinivasan, K., Dastoor, P.H., Radhakrishnaiah, P., et al.: FDAS: a knowledge-based framework for analysis of defects in woven textile structures. J. Text. Inst. 83(3), 431–448 (1992)

    Article  Google Scholar 

  2. Cui, Y., Jia, M., Lin, T.Y., et al.: Class-balanced loss based on effective number of samples. In: Proceedings of the 2019 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15 June–20 June 2019, pp. 9260–9269 (2019)

    Google Scholar 

  3. Land, E.H.: The retinex theory of color vision. Sci. Am. 237(6), 108–128 (1978)

    Article  Google Scholar 

  4. Wei, W., Shan, S., Wen, G., et al.: An improved active shape model for face alignment. In: Proceedings of the 2002 IEEE International Conference on Multimodal Interfaces (ICMI), Pittsburgh, PA, USA, 16 October 2002, pp. 523–528 (2002)

    Google Scholar 

  5. Singh, K.K., Lee, Y.J.: Hide-and-seek: forcing a network to be meticulous for weakly-supervised object and action localization. In: Proceedings of the 16th IEEE International Conference on Computer Vision (ICCV), Venice, Italy, 22 October–29 October 2017, pp. 3544–3553 (2017)

    Google Scholar 

  6. Chawla, N.V., Bowyer, K.W., Hall, L.O., et al.: SMOTE: synthetic minority over-sampling technique. J. Artif. Intell. Res. 16(1), 321–357 (2002)

    Article  Google Scholar 

Download references

Acknowledgements

The authors would like to express appreciation to Shanghai Key Laboratory of Intelligent Manufacturing & Robotics and all members of the CIMS laboratory for their support. Thanks for the funding from Shanghai Science and Technology Committee of China (No. 19511105200).

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2022 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Wan, X., Liu, L., Gao, Z., Zhang, X. (2022). Research on Image Acquisition Preprocessing and Data Augmentation Algorithm Based on Strip Surface Defect Detection Technology. In: Wang, Y., Martinsen, K., Yu, T., Wang, K. (eds) Advanced Manufacturing and Automation XI. IWAMA 2021. Lecture Notes in Electrical Engineering, vol 880. Springer, Singapore. https://doi.org/10.1007/978-981-19-0572-8_16

Download citation

Publish with us

Policies and ethics