Abstract
Authors proposed a new method for measuring contour shape at submicron level using spatial filtering and confirmed its effectiveness (Yazawa et al. in J SME-Jpn 4:17–22, 2014 [1]; Miyamoto et al. in Study of chipping inspection of cutting knife using spatial filtering, 2016 [2]). In this paper, the inspection system is propose, and the prototype is developed.
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T. Yazawa, K. Hirota, T. Otsubo, Y. Maeda, Y. Ougiya, T. Kojima, R. Yamada, High-precision profile project system for on-machine measurement of workpiece dimension. J. SME-Jpn. 4, 17–22 (2014)
Y. Miyamoto, T. Matsumoto, H. Tokunaga, T. Otsubo, M. Kuroiwa, Study of Chipping Inspection of Cutting Knife Using Spatial Filtering (ISOT, 2016)
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Shiga, H., Yazawa, T., Otsubo, T., Kuroiwa, M. (2020). Development of Chipping Inspection System of Cutting Knife Edge Using Spatial Filtering. In: Bhattacharya, I., Otani, Y., Lutz, P., Cherukulappurath, S. (eds) Progress in Optomechatronics. Springer Proceedings in Physics, vol 249. Springer, Singapore. https://doi.org/10.1007/978-981-15-6467-3_8
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DOI: https://doi.org/10.1007/978-981-15-6467-3_8
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