Reviewing Surface Defects for the Performance Degradation in the Solar Devices

Abstract

A silicon based photovoltaic (PV) cells are underlying a surface analysis for understanding its performance degradation. Approach for the split investigation based on the surface images with electrical parameter was used for analyzing the performance factors. Solar devices which are having a power hotspot for proficient electrical vitality are over time span. The defect in the cell due to the surface deformity leads to decreased in the performance parameter and affects the overall maximum power capability. The continuation to diminish wafer thickness in the fabrication process of silicon cells causes increase in the defects patterns as seen in the numerous cases studies. Reviewing the model-based system dependent on image processing algorithm especially designed for the degradation analysis capable to recognize any miniature crack before its large penetration to avoid major damage in the system. Study is based on the board surface and with the measurable symptoms in the initial phase of the degradation process. Analysis of PV cells with ARIMA model with voltage, current and power butt-centric analysis has been investigated to understand the process of its degradation. Recognition of the break and split division technique with edge detection was used in the model for its observation. Channel for split finding and recognizing its pattern is used in the modern application as seen in the recent field of the photovoltaic.