Skip to main content
SpringerLink
Log in

The Analysis and Countermeasures of Mobile Terminal RE or RSE Problem

  • Conference paper
  • First Online:
Computer Engineering and Technology (NCCET 2018)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 994))

Included in the following conference series:

  • 5334 Accesses

Abstract

Considering the electronic product stability and personal safety, most countries strictly formulate a lot of EMC compulsory certification standards in the field of information technology. However, during the authentication testing of the mobile terminals, the problem of Radiated Emission (RE) or Radiated Spurious Emission (RSE) occurs often and it is usually difficult to be solved. In this paper, reasons that result the RE and RSE problems of mobile terminals are analyzed at first. The architecture of related test system is introduced. A new method to solve the problems is proposed. And then, detailed experimental countermeasures and process are illustrated to solve the problem. Finally, some design guidance for RE/RSE problem is concluded. This paper has shown that our method is an effective way to eliminate or decrease the probability of RE/RSE problem for mobile terminal design.

This work has been supported by the Discipline of Computer Science and Technology of Shanghai Polytechnic University (Grant No. XXKZD1604).

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Gu, H.Z., Ma, S.W.: PCB Electromagnetic Compatibility Technology – Design and Practice, 1st edn. Tsinghua University Press, Beijing (2004). (in Chinese)

    Google Scholar 

  2. Dhia, S.B., Ramdani, M., Sicard, E.: Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility, 1st edn. PHEI Press, Beijing (2015). Translated by Wang H., et al. (in Chinese)

    Google Scholar 

  3. Dahlman, E., Parkvall, S., Sköld, J.: 4G LTE/LTE-Advanced for Mobile Broadband, 1st edn. Southeast University Press, Nanjing (2012)

    Google Scholar 

  4. Audone, B., Colombo, R.: Measurement of radiated spurious emissions with the substitution and field strength test methods. In: IEEE International Symposium on Electromagnetic Compatibility, pp. 353–357. IEEE Press, New York (2016)

    Google Scholar 

  5. Yu, Q.: Radiated spurious emissions measurement by substitution method. In: IEEE International Symposium on Electromagnetic Compatibility, pp. 159–164. IEEE Press, New York (2010)

    Google Scholar 

  6. Zhang, Y., Ye, S., Zhang, J., Yao, Y.: Review of conducted noise suppression method for power electronic and electrical equipment. Trans. China Electrotech. Soc. 32(14), 77–86 (2017) (in Chinese)

    Google Scholar 

  7. Patra, K., Dhar, S., Gupta, B.: Analysis of arbitrarily curved microstrip lines for radiated emission. IEEE Trans. Electromagn. Compat. 60(3), 572–579 (2018)

    Article  Google Scholar 

  8. Sayegh, A.M., Jenu, M.Z.B.M., Sapuan, S.Z., Dahlan, S.H.B.: Analytical solution for maximum differential-mode radiated emissions of microstrip trace. IEEE Trans. Electromagn. Compat. 58(5), 1417–1424 (2016)

    Article  Google Scholar 

  9. Shin, D., Kim, N., Lee, J., Park, Y., Kim, J.: Quantified design guides for the reduction of radiated emissions in package-level power distribution networks. IEEE Trans. Electromagn. Compat. 59(2), 468–480 (2017)

    Article  Google Scholar 

  10. Li, Z.Q., Wang, Z.G.: Radio Frequency Integrated Circuits and System, 1st edn. CSPM Press, Beijing (2008). (in Chinese)

    Google Scholar 

  11. Azpurua, M.A., Pous, M., Silva, F.: A single antenna ambient noise cancellation method for in-situ radiated EMI measurements in the time-domain. In: IEEE International Symposium on Electromagnetic Compatibility, pp. 501–506. IEEE Press, New York (2016)

    Google Scholar 

  12. Koo, T.W., Lee, H.S., Yook, J.G., Yoo, K., Cheon, J., Lee, S.Y.: Radiated spurious emission reduction using parasitic element for mobile applications. In: IEEE International Symposium on Electromagnetic Compatibility, pp. 760–764. IEEE Press, New York (2014)

    Google Scholar 

  13. Khorrami, M.A., Dixon, P., Arien, Y., Song, J.: Effective power delivery filtering of mixed-signal systems with negligible radiated emission. IEEE Electromagn. Compat. Mag. 5(4), 128–132 (2016)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. The College of Engineering, Shanghai Polytechnic University, Shanghai, 201209, China

    Liangliang Kong & Lin Chen

Authors
  1. Liangliang Kong
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Lin Chen
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Liangliang Kong .

Editor information

Editors and Affiliations

  1. National University of Defense Technology, Changsha, China

    Weixia Xu

  2. National University of Defense Technology, Changsha, China

    Liquan Xiao

  3. National University of Defense Technology, Changsha, China

    Jinwen Li

  4. National University of Defense Technology, Changsha, China

    Zhenzhen Zhu

Rights and permissions

Reprints and permissions

Copyright information

© 2019 Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Kong, L., Chen, L. (2019). The Analysis and Countermeasures of Mobile Terminal RE or RSE Problem. In: Xu, W., Xiao, L., Li, J., Zhu, Z. (eds) Computer Engineering and Technology. NCCET 2018. Communications in Computer and Information Science, vol 994. Springer, Singapore. https://doi.org/10.1007/978-981-13-5919-4_6

Download citation

  • DOI: https://doi.org/10.1007/978-981-13-5919-4_6

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-5918-7

  • Online ISBN: 978-981-13-5919-4

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics

Societies and partnerships

Search

Navigation