Abstract
In Sect. 12.1, a novel low-temperature crystallization path for perovskite lead zirconate titanate (PZT) from solution is reported. The modification of a PZT solution with monoethanolamine (MEA) resulted in a change in the crystallization behavior. MEA was strongly coordinated to the metal ions, resulting in reduction of Pb2+ into Pb0 because of a reducing environment at 200–300 °C. Nanoscopic separations of Pb0 were later transformed into uniformly distributed PbO nanocrystals and clusters in the amorphous Zr/Ti–O matrix and finally crystallized into perovskite at 400–500 °C. On the other hand, pyrochlore phase appeared in the conventional crystallization process. The avoidance of pyrochlore formation is a key for the low-temperature crystallization of perovskite. X-ray absorption fine structure (XAFS) analysis was performed to reveal the structures in solutions and amorphous phases.
In Sect. 12.2, a new reaction path for the low-temperature crystallization of device-quality PZT films was described. The essential aspect of this path is to circumvent pyrochlore formation at approximately 300 °C as the temperature is increased to 400 °C. In this approach, MEA was not used. Pb2+ was reduced to Pb0 by maintaining the presence of sufficient carbon via pyrolysis at 210 °C, which is well below the temperature for pyrochlore formation. This process led to insufficient Pb2+ in the film to form pyrochlore. The films were successfully crystallized onto metals and metal/oxide hybrids at 400–450 °C.
In Sect. 12.3, the same method as in Sect. 12.1 was used to form highly conductive ruthenium metal (Ru0) and ruthenium oxide (RuO2) films. Those solutions were prepared from ruthenium(III) nitrosyl acetate and amines. Ru0 and RuO2 thin films were formed when annealed under an inert atmosphere (nitrogen or vacuum) and under an oxygen atmosphere, respectively. The effects of different amine structures were compared, and alkanolamine and amino acids were found to produce Ru0 films of higher quality than films formed by alkyl amines. These results were correlated with the structures of ruthenium complexes. The resistivity values of Ru0 and RuO2 thin films prepared from ruthenium–alkanolamine complexes were 2.1 × 10−5 and 4.3 × 10−4 Ω cm, respectively, similar to those of vacuum-processed Ru0 and RuO2 ones. The Ru0 film showed high stability against oxidation during further annealing in oxygen, even at nanometer thickness (e.g., 25 nm).
In Sect. 12.4, highly conductive RuO2 thin films were prepared by a low-temperature solution process combined with green laser annealing (GLA). This process enabled the production of RuO2 films at a relatively low temperature of 250 °C. GLA led to effective sintering of the film, significantly improving its crystallinity and density, resulting in grain joining; consequently, the conductivity was dramatically increased by one order of magnitude or more. The RuO2 thin films exhibited a low resistivity (e.g., 7.6 × 10−5 Ωcm for a 40-nm-thick film), which was approximately only two times greater than that of single-crystalline RuO2. Such resistivity has not previously been achieved if thermal annealing soley used even at a temperature of 800 °C and is similar to or lower than that of vacuum-deposited RuO2 films.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
H. Kameda, J. Li, D.H. Chi, A. Sugiyama, K. Higasimine, T. Uruga, H. Tanida, K. Kato, T. Kaneda, T. Miyasako, E. Tokumitsu, T. Mitani, T. Shimoda, Crystallization of lead zirconate titanate without passing through pyrochlore by new solution process. J. Eur. Ceram. Soc. 32, 1667–1680 (2012)
N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, et al., Ferroelectric thin films: review of materials, properties, and applications. J. Appl. Phys. 100, 051606 (2006)
N. Izyumskaya, Y.I. Alivov, S.J. Cho, H. Morkoc¸, H. Lee, Y.S. Kang, Processing, structure, properties, and application of PZT thin films. Crit. Rev. Solid State Mater. Sci. 32, 111–202 (2007)
R.W. Schwartz, T. Schneller, R. Waser, Chemical solution deposition of electronic oxide films. C. R. Chim. 7, 433–461 (2004)
Y. Faheem, M. Shoaib, Sol–gel procession and characterization of phase-pure lead zirconate titanate nano-powders. J. Am. Ceram. Soc. 89, 2034–2037 (2006)
N. Martin-Arbella, Í. Bretos, R. Jiménez, M.L. Calzada, R. Sirera, Photoactivation of sol–gel precursors for the low-temperature preparation of PbTiO3 ferroelectric thin films. J. Am. Ceram. Soc. 92, 396–403 (2011)
N. Martin-Arbella, Í. Bretos, R. Jiménez, M.L. Calzada, R. Sirera, Metal complexes with N-methyldiethanolamine as new photosensitive precursors for the low-temperature preparation og ferroelectric thin films. J. Mater. Chem. 21, 9051–9059 (2011)
V.S. Tiwari, A. Kumar, V.K. Wadhawan, D. Pandey, Kinetics of formation of the pyrochlore and perovskite phases in sol–gel derived lead zirconate titanate powder. J. Mater. Res. 13, 2170–2173 (1998)
L.A. Bursill, K.G. Brooks, Crystallization of sol gel derived lead zirconate titanate thin films in argon and oxygen atmospheres. J. Appl. Phys. 75, 4501–4509 (1994)
A.D. Polli, F.F. Lange, Pyrolysis of Pb(Zr0.5Ti0.5)O3 precursors: avoiding lead partitioning. J. Am. Ceram. Soc. 78, 3401–3404 (1995)
T.I. Chang, S.C. Wang, C.P. Liu, C.F. Lin, J.L. Huang, Thermal behaviors and phase evolution of lead zirconate titanate prepared by sol–gel processing: the role of the pyrolysis time before calcination. J. Am. Ceram. Soc. 91, 2545–2552 (2008)
J. Li, H. Kameda, B.N.Q. Trinh, T. Miyasako, P.T. Tue, E. Tokumitsu, et al., A low-temperature crystallization path for device-quality ferroelectric films. Appl. Phys. Lett. 97, 102905 (2010)
K.D. Budd, S.K. Dey, D.A. Payne, Sol–gel processing of PbTiO3, PbZrO3, PZT, and PLZT thin films. Proc. Br Ceram. Soc. 36, 107–121 (1985)
M. Khanuja, S. Kala, B.R. Mehta, H. Sharma, S.M. Shivaprasad, B. Balamurgan, et al., XPS and AFM studies of monodispersed Pb/PbO core–shell nanostructures. J. Nanosci. Nanotechnol. 7, 2096–2100 (2007)
G. Mountjoy, D.M. Pickup, R. Anderson, G.W. Wallidge, M.A. Holland, R.J. Newport, et al., Changes in the Zr environment in zirconiasilica xerogels with composition and heat treatment as revealed by Zr K-edge XANES and EXAFS. Phys. Chem. Chem. Phys. 2, 2455–2460 (2000)
D. Peter, T.S. Ertel, H. Bertagnolli, EXAFS study of zirconium alkoxides as precursor in the sol–gel process: I. Structure investigation of the pure alkoxides. J. Sol–Gel Sci. Tech. 3, 91–99 (1994)
M.P. Feth, A. Weber, R. Merkle, U. Reinöhl, H. Bertagnolli, Investigation of the crystallisation behaviour of lead titanate (PT), lead zirconate (PZ) and lead zirconate titanate (PZT) by EXAFS-spectroscopy and X-ray diffraction. J. Sol–Gel Sci. Tech. 27, 193–204 (2003)
T. Yamamoto, What is the origin of pre-edge peaks in K-edge XANES spectra of 3d transition metals: electric dipole or quadrupole? Adv. X-Ray Chem. Anal. Jpn. 38, 45–65 (2007)
R.V. Vedrinskii, V.L. Kraizman, A.A. Novakovich, P.V. Demekhin, S.V. Urazhdin, Pre-edge fine structure of the 3d atom K X-ray absorption spectra and quantitative atomic structure determinations for ferroelectric perovskite structure crystals. J. Phys. Condens. Matter. 10, 9561–9580 (1998)
F. Babonneau, S. Doeuff, A. Leaustic, C. Sanchez, C. Cartier, M. Verdaguer, XANES and EXAFS study of titanium alkoxides. Inorg. Chem. 27, 3166–3172 (1988)
E.R. Camargo, E. Longo, E.R. Leite, V.R. Mastelaro, Phase evolution of lead titanate from its amorphous precursor synthesized by the OPM wet-chemical route. J. Solid State Chem. 177, 1994–2001 (2004)
Y.H. Yu, T. Tyliszczak, A.P. Hitchcock, Pb L3 EXAFS and near-edge studies of lead metal and lead oxides. J. Phys. Chem. Solids 51, 445–451 (1990)
S.S. Sengupta, L. Ma, D.L. Adler, D.A. Payne, Extended X-ray absorption fine structure determination of local structure in sol–gel-derived lead titanate, lead zirconate, and lead zirconate titanate. J. Mater. Res. 10, 1345–1348 (1995)
W.J. Moore, L. Pauling, The crystal structures of the tetragonal monoxides of lead, tin, palladium, and platinum. J. Am. Chem. Soc. 63, 1392–1394 (1941)
J.H. Lee, Y.M. Chiang, Pyrochlore-perovskite phase transformation in highly homogeneous (Pb,La)(Zr,Sn,Ti)O3 powders. J. Mater. Chem. 9, 3107–3111 (1999)
T.I. Chang, J.L. Huang, H.P. Lin, S.C. Wang, H.H. Lu, L. Wu, et al., Effect of drying temperature on structure, phase transformation of sol–gel-derived lead zirconate titanate powders. J. Alloys Compd. 414, 224–229 (2006)
D.L. Bellac, J.M. Kiat, P. Garnier, H. Moudden, P. Sciau, P.A. Buffat, et al., Mechanism of the incommensurate phase in lead oxide -PbO. Phys. Rev. B 52, 13184–13194 (1995)
S.K. Pradhan, M. Gateshki, M. Niederberger, Y. Ren, V. Petkov, PbZr1−xTixO3 by soft synthesis: structural aspects. Phys. Rev. B 76, 014114 (2007)
D.J. Teff, J.C. Huffman, K.G. Caulton, Heterometallic alkoxides of zirconium with tin(II) or lead(II). Inorg. Chem. 35, 2981–2987 (1996)
S. Daniele, R. Papiernik, L.G.H. Pfalzgraf, Single-source precursors of lead titanate: synthesis, molecular structure and reactivity of Pb2Ti2(μ4-O)(μ3-O-i-Pr)2(μ-O-i-Pr)4(O-i-Pr)4. Inorg. Chem. 34, 628–632 (1995)
K. Maki, N. Soyama, S. Mori, K. Ogi, Integr. Ferroelectr. 30, 193 (2000)
J. Perez, P.M. Vilarinho, A.L. Kholkin, Thin Solid Films 449, 20 (2004)
K. Maki, B.T. Liu, Y. So, H. Vu, R. Ramesh, J. Finder, Z. Yu, R. Droopad, K. Eisenbeiser, Integr. Ferroelectr. 52, 19 (2003)
M. Mandeljc, M. Kosec, B. Malic, Z. Samardzija, Integr. Ferroelectr. 36, 163 (2001)
Z.J. Wang, H. Kokawa, H. Takizawa, M. Ichiki, R. Maeda, Appl. Phys. Lett. 86, 212903 (2005)
A. Bhaskar, T.H. Chang, H.Y. Chang, S.Y. Cheng, Thin Solid Films 515, 2891 (2007)
X.D. Zhang, X.J. Meng, J.L. Sun, T. Lin, J.H. Chu, Appl. Phys. Lett. 86, 252902 (2005)
X.D. Zhang, X.J. Meng, J.L. Sun, T. Lin, J.H. Ma, J.H. Chu, N. Wang, J. Dho, J. Mater. Res. 23, 2846 (2008)
M.L. Calzada, I. Bretos, R. Jiménez, H. Guillon, L. Pardo, Adv. Mater. Weinheim, Ger. 16, 1620 (2004)
G. Garnweitner, J. Hentschel, M. Antonietti, M. Niederberger, Chem. Mater. 17, 4594 (2005)
T. Morita, Y. Cho, Appl. Phys. Lett. 85, 2331 (2004)
See supplementary material at https://doi.org/10.1063/1.3486462 for the details of experimental methods
A. Seifert, A. Vojta, J.S. Speck, F.F. Lange, J. Mater. Res. 11, 1470 (1996)
M.C. Robinson, D.J. Morris, P.D. Hayenga, J.H. Cho, C.D. Richards, R.F. Richards, D.F. Bahr, Appl. Phys. A Mater. Sci. Proc. 852, 135 (2006)
X.J. Lou, J. Appl. Phys. 105, 024101 (2009)
H.N. Al-Shareef, O. Auciello, A.I. Kingon, J. Appl. Phys. 77, 2146 (1995)
Y. Murakami, J. Li, D. Hirose, S. Kohara, T. Shimoda, J. Mater. Chem. C 3, 4490–4499 (2015)
R. Methaapanon, S.M. Geyer, S. Brennan, S.F. Bent, Chem. Mater. 25, 3458–3463 (2013)
Y.C. Choi, B.S. Lee, Jpn. J. Appl. Phys. 38, 4876–4880 (1999)
T.E. Hong, K.Y. Mun, S.K. Choi, J.Y. Park, S.H. Kim, T. Cheon, W.K. Kim, B.Y. Lim, S. Kim, Thin Solid Films 520, 6100–6105 (2012)
S. Bhaskar, P.S. Dobal, S.B. Majumder, R.S. Katiyay, J. Appl. Phys. 89, 2987–2992 (2001)
H. Over, Chem. Rev. 112, 3356–3426 (2012)
M.M. Steeves, D. Deniz, R.J. Lad, Appl. Phys. Lett. 96, 142103 (2010)
Y.K.V. Reddy, D. Mergel, J. Mater. Sci. Mater. Electron. 17, 1029–1034 (2006)
D.J. Yun, H. Ra, S.B. Jo, W. Maeng, S. Lee, S. Park, J.W. Jang, K. Cho, S.W. Rhee, ACS Appl. Mater. Interfaces 4, 4588–4594 (2012)
J.H. Han, S.W. Lee, S.K. Kim, S. Han, C.S. Hwang, C. Dussarrat, J. Gatineau, Chem. Mater. 22, 5700–5706 (2010)
J.H. Han, S.W. Lee, S.K. Kim, S. Han, W. Lee, C.S. Hwang, Chem. Mater. 24, 1407–1414 (2012)
A. Maniwa, H. Chiba, K. Kawano, N. Koiso, H. Oike, T. Furukawa, K. Tada, J. Vac. Sci. Technol. A 33, 01A133 (2015)
M.M. Minjauw, J. Dendooven, B. Capon, M. Schaekers, C. Detavernier, J. Mater. Chem. C 3, 132–137 (2015)
S.K. Park, R. Kanjolia, J. Anthis, R. Odedra, N. Boag, L. Wielunski, Y.J. Chabal, Chem. Mater. 22, 4867–4878 (2010)
J.Y. Park, S. Yeo, T. Cheon, S.H. Kim, M.K. Kim, H. Kim, T.E. Hong, D.J. Lee, J. Alloys Compd. 610, 529–539 (2014)
J.F. Tressler, K. Watanabe, M. Tanaka, J. Am. Ceram. Soc. 79, 525–529 (1996)
Y. Hara, S. Rengakuji, Y. Nakamura, A. Shinagawa, Electrochemistry 70, 13–17 (2002)
T. Kaneda, D. Hirose, T. Miyasako, P.T. Tue, Y. Murakami, S. Kohara, J. Li, T. Mitani, E. Tokumitsu, T. Shimoda, J. Mater. Chem. C 2, 40–49 (2014)
Y. Murakami, P.T. Tue, H. Tsukada, J. Li, T. Shimoda, Proceedings of the 20th International Display Workshops (IDW’13) (2013), pp. 1573–1576
H. Kameda, J. Li, D.H. Chi, A. Sugiyama, K. Higashimine, T. Uruga, H. Tanida, K. Kato, T. Kaneda, T. Miyasako, E. Tokumitsu, T. Mitani, T. Shimoda, J. Eur. Ceram. Soc. 32, 1667–1680 (2012)
P. Ghosh, M. Tanemura, T. Soga, M. Zamri, T. Jimbo, Solid State Commun. 147, 15–19 (2008)
S.A. Fouda, G.L. Rempel, Inorg. Chem. 18, 1–8 (1979)
A. Inatomi, M. Abe, Y. Hisaeda, Eur. J. Inorg. Chem. 2009, 4830–4836 (2009)
H.E. Toma, A.D.P. Alexiou, S. Dovidauskas, Eur. J. Inorg. Chem. 2002, 3010–3017 (2002)
M. Barth, X. Ka¨stele, P. Klu¨fers, Eur. J. Inorg. Chem. 2005, 1353–1359 (2005)
W.H. Baur, A.A. Khan, Acta Crystallogr. Sect. B: Struct. Crystallogr. Cryst. Chem. 27, 2133–2139 (1971)
D.J. Yun, S. Lee, K. Yong, S.W. Rhee, Appl. Phys. Lett. 97, 073303 (2010)
Y. Murakami, J. Li, T. Shimoda, Highly conductive ruthenium oxide thin films by a low-temperature solution process and green laser annealing. Mater. Lett. 152, 121–124 (2015)
M. Fujii, Y. Ishikawa, R. Ishihara, J.V.D. Cingel, M.R.T. Mofrad, M. Horita, et al., Low temperature high-mobility InZnO thin-film transistors fabricated by excimer laser annealing. Appl. Phys. Lett. 102, 122107 (2013)
Y. Sugawara, Y. Uraoka, H. Yano, T. Hatayama, T. Fuyuki, A. Mimura, A high-speed high-sensitivity silicon lateral trench photodetector. IEEE Electron Device Lett. 28, 395–397 (2007)
J. Jiang, S. Kuroki, K. Kotani, T. Ito, Ferroelectric properties of lead zirconate titanate thin film on glass substrate crystallized by continuous-wave green laser annealing. Jpn. J. Appl. Phys. 49, 04DH14 (2010)
D.F Foust, J.W. Rose, E.W. Balch, Method of forming ruthenium oxide films. US Patent US 6,417,062 (2002)
W.D. Ryden, A.W. Lawson, C.C. Sartain, Electrical transport properties of IrO2 and RuO2. Phys. Rev. B 1, 1494–1500 (1970)
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2019 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Shimoda, T. (2019). Improvement of Solid Through Improved Solutions and Gels (1): Utilization of Reduction Agent and Reduced Atmosphere. In: Nanoliquid Processes for Electronic Devices. Springer, Singapore. https://doi.org/10.1007/978-981-13-2953-1_12
Download citation
DOI: https://doi.org/10.1007/978-981-13-2953-1_12
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-13-2952-4
Online ISBN: 978-981-13-2953-1
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)