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Machine Learning-Based Classification of Good and Rotten Apple

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Book cover Recent Trends in Communication, Computing, and Electronics

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 524))

Abstract

An apple is one of the most cultivated and consumed fruits in the world and continuously being praised as a delicious and miracle food. It is a rich source of Vitamin A, Vitamin B1, Vitamin B2, Vitamin B6, Vitamin C, and folic acid etc, whereas the rotten fruits affect the health of human being as well as cause big economical loss in agriculture sectors and industries. Therefore, identification of rotten fruits has become a prominent research area. This paper focuses on the classification of rotten and good apple. For classification, first extract the texture features of apples such as discrete wavelet feature, histogram of oriented gradients (HOG), Law’s Texture Energy (LTE), Gray level co-occurrence matrix (GLCM) and Tamura features. After that, classify the rotten and good apples by applying various classifiers such as SVM, k-NN, logistic regression, and Linear Discriminant. The performance of proposed approach by using SVM classifier is 98.9%, which is found better with respect to the other classifiers.

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Author information

Authors and Affiliations

  1. Department of Computer Science and Engineering, MMM University of Technology, Gorakhpur, 273010, UP, India

    Shiksha Singh & Nagendra Pratap Singh

Authors
  1. Shiksha Singh
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  2. Nagendra Pratap Singh
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Corresponding author

Correspondence to Shiksha Singh .

Editor information

Editors and Affiliations

  1. University of Allahabad, Allahabad, India

    Ashish Khare

  2. Indian Institute of Information Technology, Allahabad, Uttar Pradesh, India

    Uma Shankar Tiwary

  3. Oakland University, Rochester, MI, USA

    Ishwar K. Sethi

  4. University of Allahabad, Allahabad, Uttar Pradesh, India

    Nar Singh

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© 2019 Springer Nature Singapore Pte Ltd.

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Singh, S., Singh, N.P. (2019). Machine Learning-Based Classification of Good and Rotten Apple. In: Khare, A., Tiwary, U., Sethi, I., Singh, N. (eds) Recent Trends in Communication, Computing, and Electronics. Lecture Notes in Electrical Engineering, vol 524. Springer, Singapore. https://doi.org/10.1007/978-981-13-2685-1_36

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  • DOI: https://doi.org/10.1007/978-981-13-2685-1_36

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-2684-4

  • Online ISBN: 978-981-13-2685-1

  • eBook Packages: EngineeringEngineering (R0)

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