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Multistage Interconnection Networks in Reliability Shuffle Exchange Networks

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First International Conference on Artificial Intelligence and Cognitive Computing

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 815))

Abstract

Multistage interconnection networks (MINs) are highly demand in switching process environment. MINs are well known for its cost efficiency which enables economic solution in communication and interconnection. Important features in interconnection topologies are improvement toward performance and increment of reliability. In general, the importance of the reliability will be proportionally increased with the increment of size as well as system complexity. In this paper, we proposed replicated shuffle exchange network and compared with Benes and shuffle exchange network (SEN) topology to investigate the behavior analysis of MINs reliability. Three types of behaviors, namely basic stage, extra stage, and replicated stage, have been compared in this paper. The results show that replicated network provides highest reliability performance among all topological measured.

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Author information

Authors and Affiliations

  1. Marri Laxman Reddy Institute of Technology and Management, Hyderabad, India

    Balarengadurai Chinnaiah

Authors
  1. Balarengadurai Chinnaiah
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Correspondence to Balarengadurai Chinnaiah .

Editor information

Editors and Affiliations

  1. School of Computer and Information Sciences, University of Hyderabad, Hyderabad, Telangana, India

    Raju Surampudi Bapi

  2. Department Computer Science and Engineering, MLR Institute of Technology, Hyderabad, Telangana, India

    Koppula Srinivas Rao

  3. IDRBT, Hyderabad, Telangana, India

    Munaga V. N. K. Prasad

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Chinnaiah, B. (2019). Multistage Interconnection Networks in Reliability Shuffle Exchange Networks. In: Bapi, R., Rao, K., Prasad, M. (eds) First International Conference on Artificial Intelligence and Cognitive Computing . Advances in Intelligent Systems and Computing, vol 815. Springer, Singapore. https://doi.org/10.1007/978-981-13-1580-0_55

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