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In-situ High Resolution Field Emission Imaging

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Book cover Investigations on rf breakdown phenomenon in high gradient accelerating structures

Part of the book series: Springer Theses ((Springer Theses))

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Abstract

The previous two chapters introduce the study to control the location of rf breakdown and field emission by means of high intensity laser and pin cathode. To locate uncontrolled field emitters, a novel method called in-situ high resolution field emission imaging has been proposed and successfully demonstrated in this Chapter. With this method, scattered strong emission area with high current have been observed on the cathode with high resolution (\(\sim \)100 \(\upmu \)m). The field enhancement factor \(\beta \) of selected regions on the cathode has been measured. Ex-situ SEM and WLI surface examinations reveal that \(\sim \)75% strong emission areas overlap with rf breakdown spots. The theory, simulation, and experiment of the in-situ high resolution field emission imaging will be presented in detail in this chapter.

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Authors and Affiliations

  1. Department of Engineering Physics, Tsinghua University, Beijing, China

    Jiahang Shao

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  1. Jiahang Shao
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Correspondence to Jiahang Shao .

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Shao, J. (2018). In-situ High Resolution Field Emission Imaging. In: Investigations on rf breakdown phenomenon in high gradient accelerating structures. Springer Theses. Springer, Singapore. https://doi.org/10.1007/978-981-10-7926-9_4

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