Microwave Measurement Systems

  • SatyaKesh Dubey
  • Naina Narang
  • Parmendra Singh Negi
  • Vijay Narain Ojha
Chapter
Part of the SpringerBriefs in Electrical and Computer Engineering book series (BRIEFSELECTRIC)

Abstract

In this chapter, the measurement of common microwave parameters such as RF power, attenuation, and scattering (S-) parameters are explained. An example of automated attenuation measurement is taken in detail in the next chapter based on the understanding acquired through this chapter about the nature of microwave measurements. A brief description of each parameter, instrumentation, its measurement setup, and uncertainty evaluation is given in the chapter. The first section introduces the reader to the basic measurement equipment used in modern microwave measurements. The next section enlists the common microwave measurements. The microwave measurement methods are chosen and explained in order of increasing complexity. For example, the power ratio technique uses a simple and generally available power meter and sensor, whereas there are also systems available that are specific to a single parameter, for instance, TEGAM’s VM-7 for microwave attenuation measurement. But some systems are even more versatile, such as spectrum analyzer and vector network analyzer (VNA), which are used in almost all microwave measurements.

References

  1. 1.
    N.B. Carvalho, D. Schreurs, Microwave and Wireless Measurement Techniques (Cambridge University Press, New York, 2013). ISBN: 1107004616Google Scholar
  2. 2.
    L.J. Fernández, R.J. Wiegerink, J. Flokstra, J. Sesé, H.V. Jansen, M. Elwenspoek, A capacitive RF power sensor based on MEMS technology. J. Micromech. Microeng. 16(7), 1099–1107 (2006)CrossRefGoogle Scholar
  3. 3.
    R.A. Witte, Spectrum and Network Measurements, 2nd edn. (SciTech Publishing, New Jersey, 2014). ISBN: 9781613530368Google Scholar
  4. 4.
    Evaluation of measurement data—guide to the expression of uncertainty in measurement. JCGM 100:2008, BIPM 2008Google Scholar
  5. 5.
    V.N. Ojha, Evaluation and expression of uncertainty in measurement. MAPAN J. Metrol. Soc. India 13, 71–84 (1998)Google Scholar
  6. 6.
    P. Cherry, W. Oram, G. Hjipieris, A dynamic calibrator for detector nonlinearity characterization. Microw. Eng. Europe (1995)Google Scholar
  7. 7.
    K. Holland, J. Howes, Improvements to the microwave mixer and power sensor linearity measurement capability at the national physical laboratory. IEE Proc. Sci. Measur. Technol. 149(6), 329–332 (2002)CrossRefGoogle Scholar
  8. 8.
    R. Collier, D. Skinner, Microwave Measurements, 3rd edn. (The Institution of Engineering and Technology, London, 2007)Google Scholar
  9. 9.
    Calibration interlaboratory comparisons. APLAC. 5, 1–23Google Scholar

Copyright information

© The Author(s) 2018

Authors and Affiliations

  • SatyaKesh Dubey
    • 1
  • Naina Narang
    • 2
  • Parmendra Singh Negi
    • 2
  • Vijay Narain Ojha
    • 1
  1. 1.Microwave Standards, TFEEMDCSIR-National Physical Laboratory of IndiaNew DelhiIndia
  2. 2.CSIR-National Physical Laboratory of IndiaNew DelhiIndia

Personalised recommendations