Atomic Force Microscope

  • Shintaro FujiiEmail author


AFM was developed to overcome a drawback of scanning tunneling microscopy (STM), which can only image conducting surfaces.


Surface topography Nonconducting surface Nano- or atomic-scale resolution Force spectroscopy 


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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of Chemistry, School of ScienceTokyo Institute of TechnologyTokyoJapan

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