Abstract
For safe software development on the solar integrated monitoring system, it is very important how to identify safe behaviors of the system behaviors. Therefore, it needs to test the system behaviors after the software development. To solve this problem, the existing studies have proposed the use case based test coverage analysis at all software development stages [1]. With this method, we identify the test cases based on priority of the system behaviors. In this paper, we proposes automatic test case extraction method based on state diagram among the use case-based test coverage extraction methods. That is, we can use state diagram for a system behaviors with which generates test cases to validate the system. We show an applicative case on the system behaviors of a solar integrated system with this approach.
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References
Ahn, S.B., Park, B.K., Kim, D.H., Seo, C.Y., Young Chul Kim, R.: Requirements based testing using test units. In: KCSE2011, vol. 13. no. 1, pp. 291–298 (2011)
Son, H.S., Young Chul Kim, R.: Modeling a photovoltaic monitoring system based on maintenance perspective for new & renewable energy. In: The 2nd International Joint Conference on Convergence, AACL07, pp. 144–147 (2016)
Kim, W.Y., Son, H.S., Young Chul Kim, R.: A study on test case generation based on state diagram in modeling and simulation environment. In: Kim, T., Adeli, H., Robles, R.J., Balitanas, M. (eds.) Advanced Communication and Networking. CCIS, vol. 199, pp. 299–305. Springer, Heidelberg (2011)
Acknowledgments
This work was supported by the Human Resource Training Program for Regional Innovation and Creativity through the Ministry of Education and National Research Foundation of Korea (NRF-2015H1C1A1035548).
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Park, B.K., Jang, W.S., Son, H.S., Yi, K., Young Chul Kim, R. (2017). Automatic Test Case Generation with State Diagram for Validating the Solar Integrated System. In: Kim, K., Joukov, N. (eds) Information Science and Applications 2017. ICISA 2017. Lecture Notes in Electrical Engineering, vol 424. Springer, Singapore. https://doi.org/10.1007/978-981-10-4154-9_70
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DOI: https://doi.org/10.1007/978-981-10-4154-9_70
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