Skip to main content

Sequence Generation of Test Case Using Pairwise Approach Methodology

  • Conference paper
  • First Online:
Advances in Computer and Computational Sciences

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 554))

Abstract

There are various instruction specifications in the software system that interacts with each other. While designing software system, software engineers have to face a tedious task of ensuring the validation of every available software use case. If the instruction specifications are huge, the required number of use cases to validate becomes unmanageable within reasonable time budget and therefore designers have to choose one of the options of either delaying the projects or delivering without validating all available test case scenarios. Even for moderately sized software systems, comprehensive testing sometimes becomes impossible due to limited time availability for validation phase. Empirical studies have indicated that most of the faults in software systems often precipitate by interaction between smaller numbers of instruction specifications. If designers can cover all available interactions between all pairs of instructions specifications (instead of comprehensive testing), it can give reasonable confidence to designers about the software attribute within the limited time. This paper presents one such approach which uses the sequence origination approach for pairwise test case origination. This approach makes certain to propagate the required intent of trial run cases which cover all available interactions between all instructions pairs at least once. Trial run selection specification is this approach based on combinatorial testing. The paper also discusses the results with this new approach on one of the candidate software system to demonstrate its efficacy over already existing validation approaches.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Cohen, D. M., Dalal, S. R., Fredman, M. L., and Patton, G. C., The AETG system: An Approach to Testing Based on Combinatorial Design, IEEE Transaction on Software Engineering, in 1997, 23 (7), 437–443.

    Google Scholar 

  2. Tai, K. C., Lei, Y.: A Test Generation Strategy for Pairwise Testing. IEEE Trans. On Software Engineering, in Jan 2002, 28(1) 3.

    Google Scholar 

  3. Lei, Y and Tai, K. C., In-Parameter-Order: A Test Generating Strategy for Pairwise Testing, IEEE Trans. on Software Engineering, in 2002, 28 (1), 1–3.

    Google Scholar 

  4. Dr. Mohammed Abdul Kashem, Mohammad Naderuzzaman: On An Enhanced Pairwise Search Approach for Generating Optimum Number of Test Data and Reduce Execution Time. Computer Engineering and Intelligent Systems http://www.iiste.org ISSN 2222–1719 (Paper) ISSN 2222–2863 (Online) Vol. 4, No.1, 2013.

  5. M. Mitchell, On an Introduction to Hereditary Algorithm. The MIT Press, in 1999.

    Google Scholar 

  6. I. H. Osman and G. Laporte, On “Metaheuristic: A bibliography”, Ann. Oper. Res. vol. 63, (1996), pp. 513–623.

    Google Scholar 

  7. J. Czerwonka. Pairwise Testing, combinatorial test case generation in (2010, Dec.) [online]. Available: http://www.pairwise.org.

  8. http://www.nicominds.com.

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Deepa Gupta .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer Nature Singapore Pte Ltd.

About this paper

Cite this paper

Gupta, D., Rana, A., Tyagi, S. (2018). Sequence Generation of Test Case Using Pairwise Approach Methodology. In: Bhatia, S., Mishra, K., Tiwari, S., Singh, V. (eds) Advances in Computer and Computational Sciences. Advances in Intelligent Systems and Computing, vol 554. Springer, Singapore. https://doi.org/10.1007/978-981-10-3773-3_9

Download citation

  • DOI: https://doi.org/10.1007/978-981-10-3773-3_9

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-3772-6

  • Online ISBN: 978-981-10-3773-3

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics