Abstract
This chapter provides an introduction of RF reliability and variaibility work.
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Yuan, JS. (2016). Introduction. In: CMOS RF Circuit Design for Reliability and Variability. SpringerBriefs in Applied Sciences and Technology(). Springer, Singapore. https://doi.org/10.1007/978-981-10-0884-9_1
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DOI: https://doi.org/10.1007/978-981-10-0884-9_1
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Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-0882-5
Online ISBN: 978-981-10-0884-9
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