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Improving Lifetime of Memory Devices Using Evolutionary Computing Based Error Correction Coding

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Computational Intelligence, Cyber Security and Computational Models

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 412))

Abstract

Error correction coding (ECC) plays an important role in the reliability improvement of circuits having application in space and mission critical computing-, low-power CMOS design-, microprocessor based computing-, and nanotechnology-based systems. Conventional ECC are not suitable for multiple bit detection and correction. A memory circuit holds both instruction and data of the given system and it is susceptible to multiple bit soft error problems. To mitigate such kind of problems in memory circuit, an evolutionary computing based new ECC called reconfigurable matrix code (RMC) is suggested in this paper. The proposed RMC are evaluated in terms of error correction coverage. The results show that the proposed RMC technique can drastically increase the Mean-Error-To-Failure (METF) and Mean-Time-To-failure (MTTF) up to 50 % and hence the life time of the memory devices is more compared to conventional coding techniques based memories.

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Acknowledgements

The authors are grateful for the financial support provided by the University Grant Commission (UGC), under National fellowship Scheme for PhD students, India, for this research.

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Authors and Affiliations

  1. Government College of Technology, Coimbatore, India

    A. Ahilan & P. Deepa

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  1. A. Ahilan
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  2. P. Deepa
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Correspondence to A. Ahilan .

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Editors and Affiliations

  1. Applied Mathematics and Computational Sc, PSG College of Technology, Coimbatore, Tamil Nadu, India

    Muthukrishnan Senthilkumar

  2. Applied Mathematics and Computational Sc, PSG College of Technology, Coimbatore, Tamil Nadu, India

    Vijayalakshmi Ramasamy

  3. Applied Mathematics and Computational Sc, PSG College of Technology, Coimbatore, Tamil Nadu, India

    Shina Sheen

  4. Applied Mathematics and Computational Sc, PSG College of Technology, Coimbatore, Tamil Nadu, India

    C. Veeramani

  5. Department of Mathematics, Ryerson University, TORONTO, Ontario, Canada

    Anthony Bonato

  6. Fac. Science&Technology, Deakin University, Burwood, Australia

    Lynn Batten

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Ahilan, A., Deepa, P. (2016). Improving Lifetime of Memory Devices Using Evolutionary Computing Based Error Correction Coding. In: Senthilkumar, M., Ramasamy, V., Sheen, S., Veeramani, C., Bonato, A., Batten, L. (eds) Computational Intelligence, Cyber Security and Computational Models. Advances in Intelligent Systems and Computing, vol 412. Springer, Singapore. https://doi.org/10.1007/978-981-10-0251-9_24

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  • DOI: https://doi.org/10.1007/978-981-10-0251-9_24

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-0250-2

  • Online ISBN: 978-981-10-0251-9

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