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New Directions in Tip-Enhanced Near-Field Optical Microscopy

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Nano-Optics: Principles Enabling Basic Research and Applications

Abstract

Tip-enhanced near-field optical microscopy is used since more than 10 years in different configurations on an increasing variety of sample materials. The key advantage of the method is its combination of nanoscale spatial resolution and strong signal enhancement making it possible to study the weak optical response, such as Raman scattering or photoluminescence, of tiny sample volumes [1].

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References

  1. Mauser, N., & Hartschuh, A. (2014). Tip-enhanced near-field optical microscopy. Chemical Society Reviews, 43, 1248.

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  2. Bharadwaj, P., Deutsch, B., & Novotny, L. (2009). Optical Antennas for Advanced Optical Photon, 1, 438.

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  3. Rauhut, N., Engel, M., Steiner, M., Krupke, R., Avouris, P., & Hartschuh, A. (2012). Antenna-enhanced photocurrent microscopy on single-walled carbon nanotubes at 30 nm resolution. ACS Nano, 6, 6416.

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  4. Comin, A., Ciesielski, R., Piredda, G., Donkers, K., & Hartschuh, A. (2014). Compression of ultrashort laser pulses via gated multiphoton intrapulse interference phase scans. Journal of the Optical Society of America B, 5, 1118–1125.

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Correspondence to Nicolás Coca-López .

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Coca-López, N., Mauser, N., Mancabelli, T., Comin, A., Hartschuh, A. (2017). New Directions in Tip-Enhanced Near-Field Optical Microscopy. In: Di Bartolo, B., Collins, J., Silvestri, L. (eds) Nano-Optics: Principles Enabling Basic Research and Applications. NATO Science for Peace and Security Series B: Physics and Biophysics. Springer, Dordrecht. https://doi.org/10.1007/978-94-024-0850-8_47

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  • DOI: https://doi.org/10.1007/978-94-024-0850-8_47

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-024-0848-5

  • Online ISBN: 978-94-024-0850-8

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