Abstract
The use of synchrotron induced photoelectron spectroscopy is presented for the investigation of semiconductor/electrolyte model interfaces. The model interfaces are prepared by adsorbing electrolyte components e.g. H2O and Br2/Na onto layered semiconductor van der Waals surfaces. The electric potential distributions measured for the model interfaces are related to semiconductor/ electrolyte junctions.
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Mayer, T., Jaegermann, W. (1994). Layered Semiconductor/Electrolyte Model Interfaces Investigated in UHV by Synchrotron Induced Photoelectron Spectroscopy. In: Melendres, C.A., Tadjeddine, A. (eds) Synchrotron Techniques in Interfacial Electrochemistry. NATO ASI Series, vol 432. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-3200-0_26
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DOI: https://doi.org/10.1007/978-94-017-3200-0_26
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