Abstract
Superlattices in the Pb-Tl-O system were electrodeposited with layer thicknesses ranging from 1.5 to 25 nm. Both compositional and defect-chemistry superlattices were grown. In defect-chemistry superlattices based on thallium(III) oxide, it was found that thallium interstitials were favored at low overpotentials and oxygen vacancies were favored at high overpotentials. The superlattices were studied in reciprocal space by x-ray diffraction, and in real space by scanning tunneling microscopy (STM). The x-ray pattern of a compositionally modulated sample grown under potentiostatic control exhibited superlattice satellites out to fourth order. STM images were obtained in air on cleaved cross-sections. The composition profile in the superlattices was shown to manifest itself as an apparent height profile in the STM image.. The STM helped us engineer “better” superlattices, since it was found that compositional superlattices grown under potential control had apparent height profiles which were more square than samples grown under current control.
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Switzer, J.A. (1995). Real-Space Imaging of Nanoscale Electrodeposited Ceramic Superlattices in the Scanning Tunneling Microscope. In: Gewirth, A.A., Siegenthaler, H. (eds) Nanoscale Probes of the Solid/Liquid Interface. NATO ASI Series, vol 288. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8435-7_14
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DOI: https://doi.org/10.1007/978-94-015-8435-7_14
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