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Computer Aids to Testing — An Overview

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Computer Design Aids for VLSI Circuits

Part of the book series: NATO ASI Series ((NSSE,volume 48))

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Abstract

This paper is intended to provide an overview of methods of Automatic Test Pattern Generation (ATPG) for digital logic networks. It will concentrate on methods which the author has found useful in his own experience; a good general review is given in the book by Breuer and Friedman [1].

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Author information

Authors and Affiliations

  1. IBM System Products Division, Endicott, New York, USA

    Peter S. Bottorff

Authors
  1. Peter S. Bottorff
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Editor information

Editors and Affiliations

  1. Istituto di Elettrotecnica, University of Genova, Italy

    P. Antognetti

  2. EECS Department, University of California, Berkeley, Cakifornia, USA

    D. O. Pederson

  3. Laboratory ESAT, Catholic University of Leuven, Heverlee, Belgium

    H. de Man

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© 1984 Martinus Nijhoff Publishers, Dordrecht

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Bottorff, P.S. (1984). Computer Aids to Testing — An Overview. In: Antognetti, P., Pederson, D.O., de Man, H. (eds) Computer Design Aids for VLSI Circuits. NATO ASI Series, vol 48. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-8006-1_9

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  • DOI: https://doi.org/10.1007/978-94-011-8006-1_9

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-011-8008-5

  • Online ISBN: 978-94-011-8006-1

  • eBook Packages: Springer Book Archive

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