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Design for Testability

  • Chapter
Computer Design Aids for VLSI Circuits

Part of the book series: NATO ASI Series ((NSSE,volume 48))

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Abstract

This section discusses the basic facts of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today’s technologies and techniques which have been recently introduced and will soon appear in new designs.

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General References and Surveys

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Authors and Affiliations

  1. Data Systems Division, IBM, Boulder, Colorado

    T. W. Williams

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  1. T. W. Williams
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Editors and Affiliations

  1. Istituto di Elettrotecnica, University of Genova, Italy

    P. Antognetti

  2. EECS Department, University of California, Berkeley, Cakifornia, USA

    D. O. Pederson

  3. Laboratory ESAT, Catholic University of Leuven, Heverlee, Belgium

    H. de Man

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© 1984 Martinus Nijhoff Publishers, Dordrecht

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Williams, T.W. (1984). Design for Testability. In: Antognetti, P., Pederson, D.O., de Man, H. (eds) Computer Design Aids for VLSI Circuits. NATO ASI Series, vol 48. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-8006-1_8

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  • DOI: https://doi.org/10.1007/978-94-011-8006-1_8

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