Abstract
This paper is intended for researchers who already have some knowledge of local probe microscopes (LPM) and their operational modes and who wish to begin making measurements of materials properties with nanometer-scale lateral resolution. The difficulties of making quantitative measurements are discussed. The correct choice of LPM configuration and excitation frequency can greatly enhance the signal-to-noise ratio and linearity of response of the microscope to the interaction stiffness. Rheological models of different LPM setups are used to determine the best configuration for a given experiment. Most materials are best studied by means of a transducer placed underneath the sample and excited at frequencies above the highest tip-sample resonance. Common image artifacts are identified.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
U. Dürig, J.K. Gimzewski, and D.W. Pohl. Experimental observation of forces acting during scanning tunneling microscopy. Phys. Rev. Lett., 57, 2403–06, (1986).
U. Dürig, O. Züger, and A. Stalder. Interaction force detection in scanning probe microscopy: Methods and applications. J. Appl. Phys., 72, 1778–98, (1992).
S.M. Hues, C.F. Draper, K.P. Lee, and R.J. Colton. Effect of PZT and PMN actuator hysteresis and creep on nanoindentation measurements using force microscopy. Rev. Sci. Instruments, 65, 1561–65, (1994).
J.P. Cleveland, S. Manne, D. Bocek, and P.K. Hansma. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev. Sci. Instrum., 64, 403–5, (1993).
N.A. Burnham, G. Gremaud, A.J. Kulik, P.-J. Gallo, and F. Oulevey. Materials properties measurements: Choosing the optimal SPM configuration. J. Vac. Sci. Technol. B, 14, 1308–12, (1996).
N.A. Burnham, A.J. Kulik, G. Gremaud, P.-J. Gallo, and F. Oulevey. Scanning local-acceleration microscopy. J. Vac. Sci. Technol. B, 14, 794–99, (1996).
E.-L. Florin, M. Radmacher, B. Fleck, and H.E. Gaub. Atomic force microscope with magnetic force modulation. Rev. Sci. Instrum., 65, 639–43, (1994).
S.P. Jarvis and J.B. Pethica. Hydrophobic Surface Interactions Studied Using a Novel Force Microscope, in Forces in Scanning Probe Methods, volume 286, pages 105–12. H.-J. Güntherodt, D. Anselmetti and E. Meyer, eds., Kluwer Academic NATO ASI Series, (1995).
M. Heuberger, G. Dietler, and L. Schlapbach. Mapping the local Young’s modulus by analysis of the elastic deformations occuring in atomic force microscopy. Nanotechnol., 5, 12–23, (1994).
N.A. Burnham, O.P. Behrend, F.L. Hutson, F. Oulevey, P.-J. Gallo, E. Dupas, A.J. Kulik, G. Gremaud, H.M. Pollock, and G.A.D. Briggs. How does a tip tap? to be submitted.
O. Kolosov and K. Yamanaka. Nonlinear detection of ultrasonic vibrations in an atomic force microscope. Jpn. J. Appl. Phys., 32, L1095–98, (1993).
N.A. Burnham, A.J. Kulik, G. Gremaud, and G.A.D. Briggs. Nanosubharmonics: the dynamics of small nonlinear contacts. Phys. Rev. Lett., 74, 5092–95, (1995).
N.A. Burnham, A.J. Kulik, and G. Gremaud. Tip-Surface Interactions, in Procedures in Scanning Probe Microscopy. R.J. Colton et al., eds., John Wiley and Sons, New York, (1996).
K. Takahashi, N.A. Burnham, H.M. Pollock, and T. Onzawa. Force curves obtained from elastic contact theory, and its application. to be submitted.
C.A.J. Putman, K.O. Van der Werf, B.G. De Grooth, N.F. Van Hu1st, and J. Greve. Tapping mode atomic force microscopy in liquid. Appl. Phys. Lett., 64, 2454–6, (1994).
TopoMetrix. Artifacts in SPM. Santa Clara, CA 95054, (1993).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1997 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Burnham, N.A. et al. (1997). A Beginner’s Guide to LPM Materials Properties Measurements. In: Bhushan, B. (eds) Micro/Nanotribology and Its Applications. NATO ASI Series, vol 330. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5646-2_35
Download citation
DOI: https://doi.org/10.1007/978-94-011-5646-2_35
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-6381-4
Online ISBN: 978-94-011-5646-2
eBook Packages: Springer Book Archive