Skip to main content

Magnetisation Reversal in Cobalt and Permalloy Nano-Elements

  • Chapter
  • 1124 Accesses

Part of the book series: NATO ASI Series ((NSSE,volume 338))

Abstract

We have investigated the domain structure and reversal mechanism in sub-micron sized magnetic elements using Lorentz microscopy in a transmission electron microscope (TEM). Acicular nano-elements were fabricated from thin films of Co and permalloy (NiFe) using electron beam lithography and lift-off techniques. The elements were 200 nm wide, 1.6–2.6 μm long and 20–50 nm thick, with their ends either flat (rectangular) or pointed (triangular). Fresnel and Foucault techniques were used to image the domain structure in the elements in order to measure the switching fields and observe the reversal mechanisms. It was found that the magnetic properties depended strongly on the material, element width and film thickness, and on certain aspects of their shape. In particular the presence of two pointed ends greatly increased the switching field.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   429.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   549.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD   549.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Chou, S.Y., Krauss, P.R., Kong, L., (1996) Nanoliographically defined magnetic structures and the quantum magnetic disk, J. Appl. Phys., 79, 6101–6106.

    Article  ADS  Google Scholar 

  2. Rührig, M., Porthun, S., Lodder, J.C., McVitie, S., Heyderman, L.J., Johnston, A.B., and Chapman, J.N., (1996) Electron beam fabrication and characterisation of high resolution magnetic force microscopy tips, J. Appl. Phys. 79, 2913–2919.

    Article  ADS  Google Scholar 

  3. Rührig, M., Khamsehpour, B., Kirk, K.J., Chapman, J.N., Aitchison, P., McVitie, S.,Wilkinson, C.D.W., (1996) The fabrication and magnetic properties of acicular magnetic nano-elements, IEEE Trans. Mag., in press.

    Google Scholar 

  4. Khamsehpour, B., Wilkinson, C.D.W., Chapman, J.N., Johnston, A.B., (1996) High resolution patterning of thin magnetic films to produce ultra-small magnetic elements, J.Vac.Sci.Technol.B. in press.

    Google Scholar 

  5. Chapman, J.N., Johnston, A.B., Heydermann, L.J., McVitie, S., Nicholson, W.A.P., Bormans, B., (1994), Coherent magnetic imaging by TEM, IEEE Trans. Mag., 30, 4479–4484.

    Article  ADS  Google Scholar 

  6. McVitie, S., Chapman, J.N., Zhou, L., Heyderman, L.J., Nicholson, W.A.P., (1995) In-situ magnetising experiments using coherent magnetic imaging in the TEM, J. Magn. Magn. Mat., 148, 232–236.

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1997 Springer Science+Business Media Dordrecht

About this chapter

Cite this chapter

Kirk, K.J. et al. (1997). Magnetisation Reversal in Cobalt and Permalloy Nano-Elements. In: Hadjipanayis, G.C. (eds) Magnetic Hysteresis in Novel Magnetic Materials. NATO ASI Series, vol 338. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5478-9_29

Download citation

  • DOI: https://doi.org/10.1007/978-94-011-5478-9_29

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6304-3

  • Online ISBN: 978-94-011-5478-9

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics