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Analysis of Scanning Tunneling and Atomic Force Microscopy Images

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Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

Part of the book series: Physics and Chemistry of Materials with Low-Dimensional Structures ((PCMALS,volume 22))

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Abstract

The quantum mechanical phenomenon of electron tunneling was used for the imaging of a conducting surface in atomic scale in 1982 when the first scanning tunneling microscope was built [1]. The most important feature of scanning tunneling microscopy (STM) is the real-space visualization of the surfaces of metals and semiconductors in atomic scale. The tunneling current decreases exponentially with increasing the tip-sample distance. This makes it possible to visualize surface structures with sub-angstrom resolution and detect various atomic-scale defects inaccessible by diffraction and spectroscopic techniques [2–4]. An atomic force microscope was invented to enable the detection of atomic-scale features of insulating surfaces [5]. In atomic force microscopy (AFM) the repulsive force between the tip (located at the end of a cantilever) and sample is commonly measured on the basis of the cantilever deflection. Because the repulsive force is universal, AFM is applicable to conducting as well as insulating materials.

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Authors and Affiliations

  1. Department of Chemistry, North Carolina State University, Raleigh, North Carolina, 27695-8204, USA

    Myung-Hwan Whangbo & Jingqing Ren

  2. Materials Research Center, Albert-Ludwigs University, Stefan-Meier-Str. 21, D-79104, Freiburg, Germany

    Sergei N. Magonov & Hardy Bengel

Authors
  1. Myung-Hwan Whangbo
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  2. Jingqing Ren
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  3. Sergei N. Magonov
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  4. Hardy Bengel
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Editors and Affiliations

  1. Department of Physics, Faculty of Sciences, University of Waterloo, Ontario, Canada

    Frank W. Boswell

  2. Department of Physics, Faculty of Pure and Applied Sciences, Acadia University, Wolfville, Nova Scotia, Canada

    J. Craig Bennett

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Whangbo, MH., Ren, J., Magonov, S.N., Bengel, H. (1999). Analysis of Scanning Tunneling and Atomic Force Microscopy Images. In: Boswell, F.W., Bennett, J.C. (eds) Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals. Physics and Chemistry of Materials with Low-Dimensional Structures, vol 22. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4603-6_6

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  • DOI: https://doi.org/10.1007/978-94-011-4603-6_6

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