Abstract
We present new results from the characterisation of a fully depleted 2048-row by 2048-column (2K×2K) CCD on high resistivity silicon. The CCD was fabricated at the Lawrence Berkeley National Laboratory (LBNL). This device represents a one hundred-fold increase in CCD size compared to devices previously made at LBNL. The large CCD size allows us to do accurate charge transfer efficiency measurements. A two-layer antireflection coating is modelled and compared with laboratory measurements of both quantum efficiency and reflectivity.
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References
S. E. Holland, G. Goldhaber, D. E. Groom, W. W. Moses, C. R. Pennypacker, S. Perlmutter, N. W. Wang, R. J. Stover, and M. Wei, “A 200×200 CCD Image Sensor Fabricated on High-Resistivity Silicon,” IEDM Tech. Digest, 911 (1996).
R.J. Stover, M. Wei, Y. Lee, D. K. Gilmore, S. E. Holland, D. E. Groom, W. W. Moses, S. Perlmutter, G. Goldhaber, C. R. Pennypacker, N. W. Wang, and N. Palaio, “Characterisation of a Fully Depleted CCD on High Resistivity Silicon,” SPIE 3019, 183 (1997).
D. E. Groom, S. E. Holland, M. E. Levi, N. P. Palaio, S. Perlmutter, R. J. Stover, and M. Wei, “Quantum Efficiency of a Back-illuminated CCD Imager: An Optical Approach,” SPIE 3649, 80–90 (1999).
D. E. Groom, P. H. Eberhard, S. E. Holland, M. E. Levi, N. P. Palaio, S. Perlmutter, R. J. Stover, and M. Wei, “Point-spread function in depleted and partially depleted CCDs,” these proceedings, pp. 201–216
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© 2000 Springer Science+Business Media Dordrecht
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Stover, R.J. et al. (2000). A 2K×2K High Resistivity CCD. In: Amico, P., Beletic, J.W. (eds) Optical Detectors For Astronomy II. Astrophysics and Space Science Library, vol 252. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4361-5_24
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DOI: https://doi.org/10.1007/978-94-011-4361-5_24
Publisher Name: Springer, Dordrecht
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