Abstract
An analysis of the theory and a new experimental practice of the transient short circuit current decay of solar cells has been performed. The injection level was produced by illumination and preserved during the experiments. All recombination processes have been considered. An accurate method for determining the minority carrier lifetime and the back surface recombination velocity has been derived. Sensitivity and precision of the method are shown to be related to the knowledge of structural parameters and the injection level value.
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© 1991 Springer Science+Business Media Dordrecht
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Mialhe, P., Salagnon, J.M., Pelanchon, F., Sissoko, G., Kane, M. (1991). Lifetime and Surface Recombination Determination. In: Luque, A., Sala, G., Palz, W., Dos Santos, G., Helm, P. (eds) Tenth E.C. Photovoltaic Solar Energy Conference. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-3622-8_9
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DOI: https://doi.org/10.1007/978-94-011-3622-8_9
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-5607-6
Online ISBN: 978-94-011-3622-8
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