Abstract
Measurements of the Current Voltage characteristics of photovoltaic devices are conveniently performed using flash solar simulators. Present technology of these large area pulsed simulators limits the duration of the light pulse to the range 1..2 ms, . The paper describes a measurement method to investigate possible errors introduced by the limited time response of certain cell technologies. The results show that large errors of 15% can be expected when pulsed simulated light of 1.5 ms duration is applied to back-surface field solar cells. Thin-Film technologies are less susceptible to this effect. The paper tries to model the device features relevant for this phenomena.
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References
J. Mahan, D. Barnesf Solid State Electronics, 24, (10), 989 (1981).
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© 1991 Springer Science+Business Media Dordrecht
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Ossenbrink, H., Drainer, A., Zaaiman, W. (1991). Errors in Current-Voltage Measurements of Photovoltaic Devices Introduced by Flash Simulators. In: Luque, A., Sala, G., Palz, W., Dos Santos, G., Helm, P. (eds) Tenth E.C. Photovoltaic Solar Energy Conference. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-3622-8_270
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DOI: https://doi.org/10.1007/978-94-011-3622-8_270
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-5607-6
Online ISBN: 978-94-011-3622-8
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