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Trends in Ion Implantation for Semiconductor and Optical Materials Research

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Crucial Issues in Semiconductor Materials and Processing Technologies

Part of the book series: NATO ASI Series ((NSSE,volume 222))

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Abstract

Ion implantation has played a central role in the development of Si technology. Here we review some recent trends in machine and materials research for semiconductor and optical devices.

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References

  1. R. S. Ohl, Bell Syst. Tech. J. 31, 204 (1952).

    Google Scholar 

  2. W. Shockley, U.S. Patent 2, 787, 564.

    Google Scholar 

  3. R. Middelton, Dept. of Physics. University of Pennsylvania, Philadelphia, PA 19104 (1990) FAX: 215-898 2010.

    Google Scholar 

  4. W. J. Miniscalo, J. of Lightwave Technology IEEE, 9, 234 (1991).

    Article  Google Scholar 

  5. A. Polman, D. C. Jacobson, D. J. Eaglesham, R. C. Kistler and J. M. Poate, J. Appl. Phys. 70, 3778 (1991).

    Article  CAS  Google Scholar 

  6. E. Ennen, J. Schneider, G. Pomrenke and A. Axmann, Appl. Phys. Lett. 43, 943 (1983).

    Article  CAS  Google Scholar 

  7. J. Michel, J. L. Benton, R. F. Ferrante, D. C. Jacobson, D. J. Eaglesham, E. A. Fitzgerald, Y. H. Xie, J. M. Poate and L. C. Kimerling, J. Appl. Phys. 70, 2672 (1991).

    Article  CAS  Google Scholar 

  8. D. J. Eaglesham, J. Michel, E. A. Fitzgerald, D. C. Jacobson, J. M. Poate, J. L. Benton, A. Polman, Y. H. Xie and L. C. Kimerling, Appl. Phys. Lett. 58, 2797 (1991).

    Article  CAS  Google Scholar 

  9. Y. H. Xie, E. A. Fitzgerald and Y. J. Mii, J. Appl. Phys. 70, 3223 (1991).

    Article  CAS  Google Scholar 

  10. A. E. White, K. T. Short, R. C. Dynes, J. P. Garno and J. M. Gibson, Appl. Phys. Lett. 50, 95 (1987).

    Article  CAS  Google Scholar 

  11. K. W. Goossen, A. E. White and K. T. Short, Electron. Lett. 26, 49 (1990).

    Article  Google Scholar 

  12. H. Roskos, M. C. Nuss, K. W. Goossen, D. W. Kirker, B. Tell, A. E. White, K. T. Short, D. C. Jacobson and J. M. Poate to be published “Picosecond Electron and Optoelectronics Conference”.

    Google Scholar 

  13. A. G. Cullis, N. G. Chew, C. R. Whitehouse, D. C. Jacobson, J. M. Poate and S. J. Pearton, Appl. Phys. Lett. 55, 1211 (1989).

    Article  CAS  Google Scholar 

  14. D. J. Eaglesham, J. M. Poate, D. C. Jacobson, M. Cerullo, L. N. Pfeiffer and K. West, 58, 523 (1991).

    Google Scholar 

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© 1992 Springer Science+Business Media Dordrecht

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Poate, J.M., Jacobson, D.C., Eaglesham, D.J. (1992). Trends in Ion Implantation for Semiconductor and Optical Materials Research. In: Coffa, S., Priolo, F., Rimini, E., Poate, J.M. (eds) Crucial Issues in Semiconductor Materials and Processing Technologies. NATO ASI Series, vol 222. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2714-1_18

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  • DOI: https://doi.org/10.1007/978-94-011-2714-1_18

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-5203-0

  • Online ISBN: 978-94-011-2714-1

  • eBook Packages: Springer Book Archive

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