Abstract
Photothermal, or thermal-wave, techniques for monitoring thermal and electronic properties of materials have recently been applied to high-Tc superconductors. Among the unique aspects of photothermal methods in these applications is their ability for precise, noncontact, nondestructive evaluation. As such, there has been increasing use of these techniques in characterizing single-crystalline and thin-film superconductors, in addition to the polycrystalline and ceramic compounds. This review highlights the theoretical background for thermal-wave characterization, and examines various practical measurement methodologies and their associated instrumentation. Also discussed are specific photothermal techniques for the determination of the temperature-dependent specific heat, thermal conductivity, thermal diffusivity, the simultaneous monitoring of these thermal parameters, and scanned image thermal-wave microscopy of high-Tc superconductors. Applications include measurements on ceramic, polycrystalline and single-crystal YBa2Cu3O7-x, GdBa2Cu3O7-x, DyBa2Cu3O7-x and Bi2Sr2CaCu2Ox.
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Mandelis, A., Peralta, S.B. (1992). Thermal-Wave Based Materials Characterization and Nondestructive Evaluation of High-Temperature Superconductors: A Critical Review. In: Kossowsky, R., Raveau, B., Wohlleben, D., Patapis, S.K. (eds) Physics and Materials Science of High Temperature Superconductors, II. NATO ASI Series, vol 209. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2462-1_27
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