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Recent Studies of the Supermodulus Effect

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Mechanical Properties and Deformation Behavior of Materials Having Ultra-Fine Microstructures

Part of the book series: NATO ASI Series ((NSSE,volume 233))

Abstract

Recent studies of elastic properties of superlattice thin films indicate that variations in elastic moduli often occur when the composition modulation wavelength is reduced below about 5 nm. The magnitude of these elastic anomalies is generally of the order of 15 to 30%, which is much smaller than the enhancements associated with the “supermodulus effect.” Superlattices that do display modulus variations appear to have relatively well defined interfaces, whereas systems with more diffuse interfaces display little or no effect. Recent models for the modulus anomalies, and for concomitant lattice parameter variations, have been based on effects related to the high density of interfaces characteristic of artificially multilayered thin films.

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Author information

Authors and Affiliations

  1. Department of Materials Science and Engineering, The Johns Hopkins University, Baltimore, Maryland, 21218, USA

    Robert C. Cammarata

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  1. Robert C. Cammarata
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Editors and Affiliations

  1. Division of Materials Science and Technology, Los Alamos National Laboratory, Los Alamos, New Mexico, USA

    Michael Nastasi

  2. Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico, USA

    Don M. Parkin

  3. Institut für Neue Materialien, Universität des Saarlandes, Saarbrücken, Germany

    Herbert Gleiter

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© 1993 Springer Science+Business Media Dordrecht

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Cammarata, R.C. (1993). Recent Studies of the Supermodulus Effect. In: Nastasi, M., Parkin, D.M., Gleiter, H. (eds) Mechanical Properties and Deformation Behavior of Materials Having Ultra-Fine Microstructures. NATO ASI Series, vol 233. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1765-4_10

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  • DOI: https://doi.org/10.1007/978-94-011-1765-4_10

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4775-3

  • Online ISBN: 978-94-011-1765-4

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